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Poole–Frenkel effect

Known as: Frenkel-Poole emission, Poole-Frenkel effect 
In solid-state physics, the Poole–Frenkel effect (also known as Frenkel-Poole emission) is a means by which an electrical insulator can conduct… 
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Related topics

Related topics

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Broader (1)

Quantum mechanics

Papers overview

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2013
2013
Improvement of Resistive Switching Characteristics by Thermally Assisted Forming Process for $\hbox{SiO}_{2}$-Based Structure
After high-temperature forming (HTF) and room-temperature forming treatments, the resistive switching behavior gets some… 
2011
2011
Local external signal shows larger effectiveness when imposed on the fast components in an array of inductively coupled Josephson junctions
An array of inductively coupled Josephson junctions is considered and it is shown that in presence of a fast impurity which is a… 
2010
2010
A novel low cost failure analysis technique for dielectric charging phenomenon in electrostatically actuated MEMS devices
This work presents a novel failure analysis technique for the dielectric charging phenomenon in electrostatically driven MEMS… 
2010
2010
Observation of the Poole-Frenkel effect in Tantalum Polymer capacitors
I-V and I-time measurements to characterize the Polymer-Dielectric interface of Tantalum/Ta<inf>2</inf>O<inf>5</inf>/Polymer… 
2009
2009
Distributed-Poole-Frenkel modeling of anomalous resistance scaling and fluctuations in phase-change memory (PCM) devices
Understanding the effect of size scaling on resistance window in phase-change memory (PCM) requires accurate models for… 
Highly Cited
2005
Highly Cited
2005
Bistable resistive switching of a sputter-deposited Cr-doped SrZrO/sub 3/ memory film
Sputter-deposited Cr-doped SrZrO/sub 3/-based metal-insulator-metal structures exhibited bistable resistive reversible switching… 
2003
2003
Life Tests and TDDB Life Prediction Modeling of 50 nm Silicon Nitride Capacitors
In this paper we report room temperature constant voltage life-time measurements of silicon nitride capacitors with 50 nm… 
2003
2003
Electrical properties of thin RF sputtered Ta2O5 films after constant current stress
2003
2003
Leakage Current Behavior in Common I-Layer A-SI:H P-I-N Photodiode Arrays
Hydrogenated amorphous silicon photodiode arrays form the basis of monolithic threedimensional integrated circuit sensor… 
1994
1994
Performance and off-state current mechanisms of low-temperature processed polysilicon thin-film transistors with liquid phase deposited SiO/sub 2/ gate insulator
Polysilicon thin-film transistors (poly-Si TFT's) with liquid phase deposition (LPD) silicon dioxide (SiO/sub 2/) gate insulator… 
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