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PBIST

Programmable Built-In Self-Test (PBIST) is a memory DFT feature that incorporates all the required test systems into the chip itself. The test… Expand
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Papers overview

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2011
2011
This paper presents a programmable built-in self-test (PBIST) methodology for embedded SRAMs. The BIST logic adapts the test… Expand
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2011
2011
Every new generation of process technology at Intel is developed and certified using an SRAM-based “X-chip.”X6 is the technology… Expand
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2008
2008
Every new generation of process technology at Intel is developed and certified using an SRAM-based “X-chip.” X6 is the technology… Expand
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2008
2008
Debugging memory test failures in a system-on-chip design is becoming difficult due to the growing number and sizes of the… Expand
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2008
2008
Multicore system-on-chip (SOC) design is widely used for current high-performance applications. Multicore SOCs typically include… Expand
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2000
2000
A modular 256KB advanced transfer cache tile has been developed to implement the on-die second level caches of the 0.18pm Intel… Expand
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2000
2000
A modular 256 KB advanced transfer cache tile has been developed to implement the on-die second level caches of the 0.18 /spl mu… Expand
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