PBIST

Programmable Built-In Self-Test (PBIST) is a memory DFT feature that incorporates all the required test systems into the chip itself. The test… (More)
Wikipedia

Topic mentions per year

Topic mentions per year

2000-2011
01220002011

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
This paper presents a programmable built-in self-test (PBIST) methodology for embedded SRAMs. The BIST logic adapts the test… (More)
  • figure 1
  • figure 2
  • figure 3
  • table II
  • figure 5
Is this relevant?
2008
2008
Multicore system-on-chip (SOC) design is widely used for current high-performance applications. Multicore SOCs typically include… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 6
Is this relevant?
2008
2008
Every new generation of process technology at Intel is developed and certified using an SRAM-based “X-chip.” X6 is the technology… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 5
Is this relevant?
2000
2000
A modular 256 KB advanced transfer cache tile has been developed to implement the on-die second level caches of the 0.18 /spl mu… (More)
  • table 1
  • figure 3
  • figure 1
  • figure 7
  • figure 8
Is this relevant?