Skip to search formSkip to main contentSkip to account menu

JTAG

Known as: 1149.1, IEEE 1149, Wiggler (JTAG) 
The Joint Test Action Group (JTAG) is an electronics industry association formed in 1985 for developing a method of verifying designs and testing… 
Wikipedia (opens in a new tab)

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2009
2009
Photodynamic therapy (PDT) is a method of treating cancer that combines light and light-sensitive drugs to selectively destroy… 
2008
2008
We present a methodology to debug a SOC by concentrating on its communication. Our extended communication model includes a… 
2002
2002
Embedded test of memory and random logic can enable very low cost ATE to test large, high speed ICs because high quality at-speed… 
2002
2002
To enable the efficient use of debug functionality on a core-based system chip, existing core-level debug interfaces need to be… 
Highly Cited
2001
Highly Cited
2001
This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for… 
Highly Cited
1998
Highly Cited
1998
The rapid emergence of reusable core-based designs, in the last few years, poses new challenges to the IEEE test access standard… 
Highly Cited
1993
Highly Cited
1993
This paper gives a proposal for an analog testability bus that could be used as the basis for a standard such as IEEE P1149.4… 
1992
1992
  • L. Whetsel
  • 1992
  • Corpus ID: 34757944
1991
1991
  • D. Bhavsar
  • 1991
  • Corpus ID: 43659899
Tbts paper presents an arclcecrute for niakms the EEE Standard 1139.1 lest acces port did dl it? major provisions available on a… 
1991
1991
  • J. KoeterS. Sparks
  • 1991
  • Corpus ID: 60875272
As board and packaging techniques continue to drive to smaller geometries and increased densities, it becomes increasingly…