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JTAG

Known as: 1149.1, IEEE 1149, Wiggler (JTAG) 
The Joint Test Action Group (JTAG) is an electronics industry association formed in 1985 for developing a method of verifying designs and testing… 
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ARM architectureARM7AVR ButterflyAVR32

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2008
2008
Debugging Distributed-Shared-Memory Communication at Multiple Granularities in Networks on Chip
We present a methodology to debug a SOC by concentrating on its communication. Our extended communication model includes a… 
2002
2002
IEEE 1149.1-compliant access architecture for multiple core debug on digital system chips
To enable the efficient use of debug functionality on a core-based system chip, existing core-level debug interfaces need to be… 
Highly Cited
2001
Highly Cited
2001
Enhanced Reduced Pin-Count Test for Full-Scan Design
This paper presents enhanced reduced pin-count test (E-RPCT) for low-cost test. E-RPCT is an extension of traditional RPCT for… 
1999
1999
An embedded technique for at-speed interconnect testing
A new embedded test technique which provides full at-speed testing of board level interconnect is described. The proposed… 
Highly Cited
1998
Highly Cited
1998
Hierarchical test access architecture for embedded cores in an integrated circuit
The rapid emergence of reusable core-based designs, in the last few years, poses new challenges to the IEEE test access standard… 
1997
1997
A BIST and Boundary-Scan Economics Framework
IC level built-in self-test and IEEE 1149.1 boundary-scan architecture offer potential benefits at all phases of a product's life… 
Highly Cited
1993
Highly Cited
1993
Structure and metrology for an analog testability bus
This paper gives a proposal for an analog testability bus that could be used as the basis for a standard such as IEEE P1149.4… 
1992
1992
A Proposed Method of Accessing 1149.1 in a Backplane Environment
  • L. Whetsel
  • Proceedings International Test Conference
  • 1992
  • Corpus ID: 34757944
1991
1991
An Architecture for Extending the IEEE Standard 1149.1 Test Access Port to System Backplanes
  • D. Bhavsar
  • , Proceedings. International Test Conference
  • 1991
  • Corpus ID: 43659899
Tbts paper presents an arclcecrute for niakms the EEE Standard 1139.1 lest acces port did dl it? major provisions available on a… 
Highly Cited
1990
Highly Cited
1990
A language for describing boundary scan devices
Boundary scan (IEEE Standard 1149.1-1990) technology is beginning to be embraced in chip and board designs. One key need is a way… 
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