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Microscopy, Atomic Force

Known as: atomic force microscope (AFM), Scanning Force Microscopies, AFM 
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The… 
National Institutes of Health

Related topics

Related topics

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Broader (2)

Atomic Resolution MicroscopyMicroscopy
Microscopy, Scanning TunnelingNanotechnologySICM (scanning ion conductance microscopy)Scanning Probe Microscopes (device)

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2013
Highly Cited
2013
Real-Space Identification of Intermolecular Bonding with Atomic Force Microscopy
Imaging Hydrogen Bonds The decoration of atomic force microscope tips with terminal CO molecules has afforded much higher… 
Highly Cited
2006
Highly Cited
2006
Identification of nanoscale dissipation processes by dynamic atomic force microscopy.
Identification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force… 
Highly Cited
2005
Highly Cited
2005
Measurement of the elastic modulus of single bacterial cellulose fibers using atomic force microscopy.
The ability of the atomic force microscope to measure forces with subnanonewton sensitivity at nanometer-scale lateral… 
Highly Cited
2003
Highly Cited
2003
Enzyme-Coated Carbon Nanotubes as Single-Molecule Biosensors
We demonstrate the use of individual semiconducting single-wall carbon nanotubes as versatile biosensors. Controlled attachment… 
Highly Cited
2003
Highly Cited
2003
Hysteresis caused by water molecules in carbon nanotube field-effect transistors
Carbon nanotube field-effect transistors commonly comprise nanotubes lying on SiO2 surfaces exposed to the ambient environment… 
Highly Cited
2003
Highly Cited
2003
Real-space observation of current-driven domain wall motion in submicron magnetic wires.
We report direct observation of current-driven magnetic domain wall (DW) displacement by using a well-defined single DW in a… 
Highly Cited
2002
Highly Cited
2002
Capillary forces in tapping mode atomic force microscopy
We investigated the influence of the relative humidity on amplitude and phase of the cantilever oscillation while operating an… 
Highly Cited
1998
Highly Cited
1998
HIGH-SPEED FORCE SENSOR FOR FORCE MICROSCOPY AND PROFILOMETRY UTILIZING A QUARTZ TUNING FORK
Force sensors are key elements of atomic force microscopes and surface profilometers. Sensors with an integrated deflection meter… 
Highly Cited
1997
Highly Cited
1997
Phase imaging and stiffness in tapping-mode atomic force microscopy
Review
1988
Review
1988
Scanning tunneling microscopy and atomic force microscopy: application to biology and technology.
The scanning tunneling microscope (STM) and the atomic force microscope (AFM) are scanning probe microscopes capable of resolving… 
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