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Scanning Probe Microscopes (device)
Known as:
SPM
, AFM
, SFM
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A microscope that forms images of surfaces using a physical probe that scans the specimen and records the probe-surface interaction as a function of…
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National Institutes of Health
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Related topics
Related topics
3 relations
Atomic Resolution Microscopy
Microscopy, Atomic Force
Scanning Tunneling Microscopes (device)
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
Nanoscale mapping and affinity constant measurement of signal-transducing proteins by atomic force microscopy.
Il Hong Kim
,
M. N. Lee
,
S. Ryu
,
Joon Won Park
Analytical Chemistry
2011
Corpus ID: 20105105
Atomic force microscope (AFM) was used to measure the interaction force between two signal-transducing proteins, glyceraldehyde-3…
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2008
2008
Atomic contributions to friction and load for tip-self-assembled monolayers interactions
M. T. Knippenberg
,
P. Mikulski
,
B. Dunlap
,
J. Harrison
2008
Corpus ID: 20710286
Scanning force microscopies SFM are being routinely used to examine the mechanical and tribological properties of materials with…
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2006
2006
Thermally assisted magnetic recording
Koji Matsumoto
,
A. Inomata
,
S. Hasegawa
2006
Corpus ID: 67808497
Thermally assisted magnetic recording can solve fundamental problems concerning thermal fluctuation and write capability in…
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2004
2004
Dendrimer Monolayers as Negative and Positive Tone Resists for Scanning Probe Lithography
M. Rolandi
,
I. Suez
,
H. Dai
,
J. Fréchet
2004
Corpus ID: 53058338
A new scanning probe lithography scheme based on a self-assembled dendrimer monolayer on thin Ti films is presented. The method…
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Highly Cited
2002
Highly Cited
2002
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
B. Rezek
,
J. Stuchlík
,
A. Fejfar
,
J. Kǒcka
2002
Corpus ID: 54899901
Hydrogenated microcrystalline silicon (μc-Si:H) layers with thickness from 100 to 540 nm were prepared in situ by plasma enhanced…
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2001
2001
Thermal deformation measurement of electronic packages using the atomic force microscope scanning moiré technique
Yun-Guang Lu
,
Zhao-Wei Zhong
,
+4 authors
A. Asundi
2001
Corpus ID: 25218574
In this article, the feasibility of atomic force microscope (AFM) scanning moire on a cross-line diffraction grating has been…
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2000
2000
Microvolume field-effect pH sensor for the scanning probe microscope
S. Manalis
,
E. Cooper
,
+5 authors
C. Quate
2000
Corpus ID: 11750450
A pH sensitive scanning probe is realized by integrating a micron-sized field-effect sensor onto a cantilever designed for an…
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2000
2000
Nanoscale selective-area epitaxial growth of Si using an ultrathin SiO2/Si3Ni4 mask patterned by an atomic force microscope
T. Yasuda
,
S. Yamasaki
,
S. Gwo
2000
Corpus ID: 55723347
We report selective epitaxial growth of Si using an ultrathin bilayer mask. The key feature of this process is direct writing of…
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1998
1998
USING SYNTHETIC OR BEESWAX ALKANES FOR ESTIMATING SUPPLEMENT INTAKE IN SHEEP
H. Dove
,
M. Olian
1998
Corpus ID: 55972534
SUMMARY Intakes of perennial ryegrass chaff/sunflower meal (SFM) mixtures were estimated in 24 crossbred young sheep, from the…
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Review
1994
Review
1994
Theoretical and experimental investigation of force imaging at the atomic scale on alkali halide crystals.
A. L. Shluger
,
R. M. Wilson
,
R. Williams
Physical Review B (Condensed Matter)
1994
Corpus ID: 21461168
Assuming a model tip (Si4O10H10) as a reasonable representation of the surface of a Si3N4 cantilever stylus having a hydrogen…
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