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Microscopy, Atomic Force

Known as: atomic force microscope (AFM), Scanning Force Microscopies, AFM 
A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The… 
National Institutes of Health

Papers overview

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Highly Cited
2008
Highly Cited
2008
We describe local (~150 nm resolution), quantitative measurements of charge carrier mobility in conjugated polymer films that are… 
Highly Cited
2006
Highly Cited
2006
We report scanned probe characterizations of the ferroelectric phase transition in individual barium titanate (BaTiO3) nanowires… 
Highly Cited
2005
Highly Cited
2005
Wang et al recently reported multiferroic behavior, with ferromagnetic and ferroelectric polarizations that are both large at… 
Highly Cited
2003
Highly Cited
2003
Highly Cited
2003
Highly Cited
2003
Interfacing semiconducting nanostructures with conducting or insulating substrates to attain a three-dimensional (3D) integrated… 
Highly Cited
2002
Highly Cited
2002
Direct measurements of the pull-off (adhesion) forces between pharmaceutical particles (beclomethasone dipropionate, a peptide… 
Highly Cited
1999
Highly Cited
1999
Late-onset diabetes is typically associated with amyloid deposits of fibrillar amylin in the pancreatic islets. Aqueous synthetic… 
Highly Cited
1996
Highly Cited
1996
The general features of tapping mode operation of a scanning force microscope are presented. Relevant factors of tapping mode… 
Highly Cited
1995
Highly Cited
1995
The nanoscale visualization and control of domain structure with atomic force microscopy (AFM) in the ferroelectric crystal…