FAQ

Micropipe

A micropipe, also called a micropore, microtube, capillary defect or pinhole defect, is a crystallographic defect in a single crystal substrate… (More)
Wikipedia

Topic mentions per year

Topic mentions per year

1994-2016
01219942016

Related topics

Related topics

5 relations
Crystal structureEpitaxyPower semiconductor deviceWafer

Broader (1)

Semiconductor device fabrication

Related mentions per year

Related mentions per year

1937-2018
19401960198020002020
Micropipe
Semiconductor device fabrication
Epitaxy
Crystal structure
Wafer
Power semiconductor device

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Mapping of micropipes and downfalls on 4H-SiC epilayers by Candela optical surface analyzer
We use Candela CS20 optical surface analyzer to detect micropipe and downfall defects of 4H-SiC epilayers grown on 3-inch 4H-SiC… (More)
  • figure 1
  • figure 2
  • figure 3
Is this relevant?
2010
2010
High-purity semi-insulating 4H-SiC as a high-voltage switch material
A photoconductive semiconductor switch (PCSS) fabricated from high-purity semi-insulating (HPSI) 4H-SiC is presented. This switch… (More)
  • figure 1
  • table I
  • figure 2
  • figure 3
  • figure 5
Is this relevant?
2010
2010
3000V, 25A pulse power asymmetrical highly interdigitated SiC Thyristors
A 3000V, 25A asymmetrical Silicon Carbide (SiC) Thyristor for pulse power applications is described here. It was fabricated on… (More)
  • figure 1
  • figure 2
  • figure 5
  • figure 3
  • figure 6
Is this relevant?
2009
2009
Noncontact Laser Inspection Based on a PSD for the Inner Surface of Minidiameter Pipes
A new noncontact laser-inspection technique based on a position-sensitive detector (PSD) to inspect the inner surface of… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 6
  • figure 4
Is this relevant?
2008
2008
2D Fringe Probing of Liquid Film Dynamics of a Plug Bubble in a Micropipe
Research on bubble dynamics and heat transfer in micropipe two-phase flows is an important area in micro electronic cooling… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 5
Is this relevant?
2005
2005
Measurements of interfacial film thickness for immiscible liquid–liquid slug/droplet flows
Abstract A novel method for measuring the interfacial liquid film thickness between immiscible liquids of a slug/droplet in a… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 5
Is this relevant?
2004
2004
Characterization and Mapping of Crystal Defects in Silicon Carbide
A method is presented for detecting, counting and mapping dislocations and micropipes in n, undoped, and semi-insulating Silicon… (More)
  • figure 1
  • figure 3
  • figure 2
  • figure 4
  • figure 5
Is this relevant?
1999
1999
High temperature, high current, p-channel UMOS 4H-SiC IGBT
Commercial silicon Insulated Gate Bipolar Transistors (IGBTs) offer an excellent balance in terms of on-state voltage drop, speed… (More)
  • figure 2
  • figure 3
  • figure 4
  • figure 5
  • figure 1
Is this relevant?
1998
1998
BREAKDOWN DEGRADATION ASSOCIATED WITH ELEMENTARY SCREW DISLOCATIONS IN 4H-SiC PN JUNCTION RECTIFIERS
It is well-known that SiC wafer quality deficiencies are delaying the realization of outstandingly superior 4H-SiC power… (More)
  • figure 1
  • figure 2
  • figure 3
  • figure 4
  • figure 5
Is this relevant?
1994
1994
Performance limiting micropipe defects in silicon carbide wafers
Reports on the characteristics of a major defect in mass-produced silicon carbide wafers which severely limits the performance of… (More)
  • figure 1
  • figure 3
  • figure 2
  • figure 4
Is this relevant?