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In-circuit emulation
Known as:
In-circuit debugger
, Background debug module
, On-chip debugging
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In-circuit emulation (ICE) is the use of a hardware device or in-circuit emulator used to debug the software of an embedded system. It operates by…
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Related topics
Related topics
21 relations
Background debug mode interface
Breakpoint
Brick (electronics)
Central processing unit
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Broader (1)
Debugging
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
XDebugger: An Elastic Solution to Dynamic Batch In-Circuit Debuggingon FPGA
Fulong Chen
,
Yunxiang Sun
,
+4 authors
Q. Tang
2015
Corpus ID: 17698834
In digital system design, Intellectual Property (IP) reuse technology reduces the complexity of System on a Chip (SoC) design…
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2012
2012
Single Cycle Access Structure for Logic Test
Tobias Strauch
IEEE Transactions on Very Large Scale Integration…
2012
Corpus ID: 3253238
This paper proposes a new single cycle access test structure for logic test. It eliminates the peak power consumption problem of…
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2010
2010
Audio and Video Transmission Card Based on PCI9054 Bus Controller
Z. Huang
,
X. Ye
Second International Workshop on Education…
2010
Corpus ID: 41921428
The performance of PCI9054 bus controller is introduced in this paper, high-speed Audio and Video transmission card based on…
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2009
2009
A trace-capable instruction cache for cost efficient real-time program trace compression in SoC
Chun-Hung Lai
,
Fu-Ching Yang
,
Chung-Fu Kao
,
Ing-Jer Huang
46th ACM/IEEE Design Automation Conference
2009
Corpus ID: 15225461
This paper presents a novel approach to make the on-chip instruction cache of a SoC to function simultaneously as a regular…
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2003
2003
IEEE 1149.1 based defect and fault tolerant scan chain for wafer scale integration
Meng Lu
,
Y. Savaria
,
Bingsen Qiu
,
Jacques Taillefer
Proceedings 18th IEEE Symposium on Defect and…
2003
Corpus ID: 1380424
This paper presents an IEEE 1149.1 based defect and fault tolerant scan chain usable for testing and configuring large area and…
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2003
2003
Constraints on the Use of Boundary-Scan for Fault Injection
Luís Santos
,
M. Z. Rela
Latin-American Symposium on Dependable Computing
2003
Corpus ID: 14586423
The Boundary-Scan technology was proposed fifteen years ago to overcome the limitations of testing digital devices due to the…
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2002
2002
Virtual in-circuit emulation for timing accurate system prototyping
L. Benini
,
D. Bruni
,
N. Drago
,
F. Fummi
,
M. Poncino
15th Annual IEEE International ASIC/SOC…
2002
Corpus ID: 60926975
This paper presents a novel HW/SW verification methodology called virtual in-circuit emulation, that is suitable for a platform…
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Review
1997
Review
1997
Embedded software in real-time signal processing systems: application and architecture trends
P. Paulin
,
C. Liem
,
M. Cornero
,
F. Naçabal
,
G. Goossens
Proceedings of the IEEE
1997
Corpus ID: 1171732
We present an extensive survey of trends in embedded processor use with an emphasis on emerging applications in wireless…
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1994
1994
An in-circuit emulator for TMS320C25
P. Ching
,
Y. Cheng
,
M. Ko
1994
Corpus ID: 62053863
An in-circuit emulator (ICE) is a piece of indispensable equipment in developing a microprocessor-based system. Digital signal…
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1979
1979
Software development and system testing techniques
Martin Whitbread
Microprocessors and microsystems
1979
Corpus ID: 39280164
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