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Design Automation and Test in Europe

Known as: Date, Design, Automation, and Test in Europe 
Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design automation. It is typically held in March… 
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Related topics

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7 relations
Asia and South Pacific Design Automation ConferenceBridging faultDesign Automation ConferenceElectronic design automation

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Guest Editors' Introduction: Special Section on Emerging Memory Technologies in Very Large Scale Computing and Storage Systems
The eleven papers in this special section focus on both system- and circuit-level aspects of emerging memory and storage… 
2014
2014
Automatic verification of Floating Point Units
Floating Point Units (FPUs) pose a singular challenge for traditional verification methods, such as coverage driven simulation… 
Review
2010
Review
2010
Design, Automation, and Test in Europe: The Most Influential Papers of 10 Years DATE
In 2007 The Design, Automation and Test in Europe (DATE) conference celebrated its tenth anniversary. As a tribute to the chip… 
2009
2009
Interconnection fabric design for tracing signals in post-silicon validation
  • Xiao LiuQ. Xu
  • 46th ACM/IEEE Design Automation Conference
  • 2009
  • Corpus ID: 8462955
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective… 
2007
2007
Redundancy Analysis and a Distributed Self-Organization Protocol for Fault-Tolerant Wireless Sensor Networks∗
Sensor nodes in a distributed sensor network can fail due to a variety of reasons, e.g., harsh environmental conditions, sabotage… 
2006
2006
Design and Implementation of SoD Engine for Linux
Software-on-demand (SoD) is an emerging technology that enables S/W applications to be executed on-demand without download and… 
2005
2005
Modélisation niveau système de SoC reconfigurables
Résumé L’objectif de cet article est de proposer un modèle de formalisation de l’ensemble des objets matériels et logiciels… 
2005
2005
Combating Hot Carrier Effects via Bit-level Transition Balancing
In this paper, we address the issue of hot-carriers and their impact on reducing the reliability of a VLSI circuit by… 
2005
2005
FOUNDATIONS OF HYBRID AND EMBEDDED SYSTEMS AND SOFTWARE NSF/ITR PROJECT – AWARD NUMBER: CCR-00225610 UNIVERSITY OF CALIFORNIA AT BERKELEY
s for key publications representing project findings during this reporting period, are provided here. These are listed… 
1999
1999
Proceedings : Design, Automation and Test in Europe Conference and Exhibition 1999 : Munich, Germany March 9-12, 1999
This collection of essays provides a forum for the exchange of information on relevant issues and topics including: sequential… 
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