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Design Automation and Test in Europe
Known as:
Date
, Design, Automation, and Test in Europe
Design, Automation & Test in Europe, or DATE is a yearly conference on the topic of electronic design automation. It is typically held in March…
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Asia and South Pacific Design Automation Conference
Bridging fault
Design Automation Conference
Electronic design automation
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Dataset supporting the article entitled "Online Concurrent Workload Classification for Multi-core Energy Management"
K. R. Basireddy
,
A. Singh
,
G. Merrett
,
B. Al-Hashimi
2017
Corpus ID: 196138404
This dataset supports the article entitled "Online Concurrent Workload Classification for Multi-core Energy Management" accepted…
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2010
2010
Cross-Layer Customization for low Power and High Performance Embedded Multi-Core Processors
Chenjie Yu
2010
Corpus ID: 28610414
Title of dissertation: CROSS-LAYER CUSTOMIZATION FOR LOW POWER AND HIGH PERFORMANCE EMBEDDED MULTI-CORE PROCESSORS Chenjie Yu…
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2009
2009
Interconnection fabric design for tracing signals in post-silicon validation
Xiao Liu
,
Q. Xu
46th ACM/IEEE Design Automation Conference
2009
Corpus ID: 8462955
Post-silicon validation has become an essential step in the design flow of today's complex integrated circuits. One effective…
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2008
2008
Meeting the design challenges of nano-CMOS electronics, design automation and test in Europe
A. Asenov
,
R. Sinnott
,
+10 authors
D. Berry
2008
Corpus ID: 107445607
2006
2006
2006 DESIGN AUTOMATION AND TEST IN EUROPE, VOLS 1-3, PROCEEDINGS
Y. Yi
,
Ioannis Nouslas
,
M. Milward
,
S. Khawam
,
T. Arslan
,
Iain A. B. Lindsay
2006
Corpus ID: 63968426
2005
2005
Modélisation niveau système de SoC reconfigurables
Imene Benkermi
,
Amine Benkhelifa
,
D. Chillet
,
Sébastien Pillement
,
Jean-Christophe Prévotet
,
F. Verdier
2005
Corpus ID: 18157879
Résumé L’objectif de cet article est de proposer un modèle de formalisation de l’ensemble des objets matériels et logiciels…
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2005
2005
Combating Hot Carrier Effects via Bit-level Transition Balancing
Y. Aghaghiri
,
Massoud Pedram
2005
Corpus ID: 7988350
In this paper, we address the issue of hot-carriers and their impact on reducing the reliability of a VLSI circuit by…
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Review
2001
Review
2001
DATE 2001 - Trip Report
M. Varea
,
Cheng-Kok Koh
2001
Corpus ID: 14207119
The Design Automation and Test in Europe (DATE) conference is the main European event in the field of Computer Aided Design (CAD…
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1999
1999
Proceedings : Design, Automation and Test in Europe Conference and Exhibition 1999 : Munich, Germany March 9-12, 1999
Dominique Borrione
,
Rolf Ernst
1999
Corpus ID: 116390797
This collection of essays provides a forum for the exchange of information on relevant issues and topics including: sequential…
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1997
1997
Design, Design Automation, And Test In Europe
P. Marwedel
,
C. López-Barrio
IEEE Design & Test of Computers
1997
Corpus ID: 7733092