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Advanced silicon etching
Known as:
ASE
, Advanced Silicon Etch
Advanced silicon etching (ASE) is a deep reactive ion etching (DRIE) technique to rapidly etch deep and high aspect ratio structures in silicon.ASE…
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Related topics
Related topics
3 relations
Broader (2)
Etching (microfabrication)
Semiconductor device fabrication
Microelectromechanical systems
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Etch challenges and evolutions for atomic-order control
M. Honda
,
T. Katsunuma
IEEE 16th International Conference on…
2016
Corpus ID: 31163395
We introduce a state-of-the-art self-aligned contact (SAC) process and patterning process developed by new patterning technology…
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2015
2015
System-Level Variation Analysis for Interconnection Networks at Sub-10-nm Technology Nodes Using Multiple Patterning Techniques
C. Pan
,
R. Baert
,
I. Ciofi
,
Z. Tokei
,
A. Naeemi
IEEE Transactions on Electron Devices
2015
Corpus ID: 21993808
This paper analyzes the impact of the interconnect variation at the system level in terms of clock frequency based on a fast and…
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Highly Cited
2011
Highly Cited
2011
Flexible 2D layout decomposition framework for spacer-type double pattering lithography
Y. Ban
,
K. Lucas
,
D. Pan
Design Automation Conference
2011
Corpus ID: 15000062
A spacer-type self-aligned double pattering (SADP) is a pitch-splitting sidewall image method that is a major option for sub-30nm…
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2009
2009
Double patterning lithography: double the trouble or double the fun?
P. Zimmerman
2009
Corpus ID: 55303812
Delays in readiness of next generation lithography (NGL) suggest the use of existing methods to enable the production of key…
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Highly Cited
2007
Highly Cited
2007
A Comparison of Nanometer-Scale Growth and Dissolution Features on Natural and Synthetic Dolomite Crystals: Implications for the Origin of Dolomite
Stephen E. Kaczmarek
,
D. Sibley
2007
Corpus ID: 44192414
Abstract This paper describes experiments in which mechanisms of crystal growth are inferred from the surface nanotopography of…
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2006
2006
A Novel Self-Aligned Etch-Stopper Structure With Lower Photo Leakage for AMLCD and Sensor Applications
C. Liang
,
F. Gan
,
Po-Tsun Liu
,
F. Yeh
,
S.H.-L. Chen
,
T. Chang
IEEE Electron Device Letters
2006
Corpus ID: 32088788
In this letter, the authors introduce a novel self-aligned etch-stopper sidewall-contact hydrogenated amorphous silicon (a-Si : H…
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Highly Cited
2003
Highly Cited
2003
Sidewall roughness control in advanced silicon etch process
H.C. Liu
,
Y. Lin
,
W. Hsu
2003
Corpus ID: 54991038
In ICP-RIE process, there have been many investigations on etching rate. However, only few published reports mentioned the…
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1998
1998
Advanced silicon trench etching in MEMS applications
K. Kuehl
,
S. Vogel
,
U. Schaber
,
Rainer Schafflik
,
B. Hillerich
Photonics West - Micro and Nano Fabricated…
1998
Corpus ID: 109653191
A high performance silicon dry etch process (STS Advanced Silicon Etch ASE) which in many cases is a beneficial replacement for…
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1994
1994
Developing consistency in enamel etching by CO2 laser
Cesar D. Gonzalez
,
K. Zakariasen
Photonics West - Lasers and Applications in…
1994
Corpus ID: 67779081
This research was designed to ascertain which CO2 laser exposure parameters result in consistent etching of enamel. Fourteen non…
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1989
1989
Effect of Transport and Reaction on the Shape Evolution of Cavities during Wet Chemical Etching
C. Shin
,
D. J. Economou
1989
Corpus ID: 96607405
The effect of fluid flow, transport, and reaction on the shape evolution of two‐dimensional cavities during wet chemical etching…
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