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Transmission-line pulse
Known as:
TLP
, Transmission line pulse
Transmission-Line Pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic…
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Integrated circuit
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
ESD characterization of atomically-thin graphene
Hong Li
,
C. Russ
,
W. Liu
,
D. Johnsson
,
H. Gossner
,
K. Banerjee
Electrical Overstress / Electrostatic Discharge…
2012
Corpus ID: 29724417
A first-time study of ESD characterization of atomically-thin graphene is reported. In a material comprising only a few atomic…
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Highly Cited
2011
Highly Cited
2011
Modeling, control, and stability analysis for time-delay TLP systems using the fuzzy Lyapunov method
Cheng-Wu Chen
Neural Computing and Applications
2011
Corpus ID: 12751996
In this study, we present a Takagi–Sugeno (T–S) fuzzy model for the modeling and stability analysis of oceanic structures. We…
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2009
2009
Implementation of buffered Super-Junction LDMOS in a 0.18um BCD process
I. Park
,
Yong-Keon Choi
,
+7 authors
K. Yoo
21st International Symposium on Power…
2009
Corpus ID: 43180517
We experimentally demonstrate a Super-Junction LDMOS transistor in a 0.18 µm BCD technology. The buffered Super-Junction…
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2007
2007
ESD robustness of AlGaN/GaN HEMT devices
A. Tazzoli
,
F. Danesin
,
E. Zanoni
,
G. Meneghesso
29th Electrical Overstress/Electrostatic…
2007
Corpus ID: 45874845
We have investigated the robustness of GaN-HEMT devices submitted to ESD events in different configurations. A good scaling of…
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2006
2006
Characterization and modeling of three CMOS diode structures in the CDM to HBM timeframe
M. Stockinger
,
J. Miller
Electrical Overstress/Electrostatic Discharge…
2006
Corpus ID: 26904124
We present advanced TLP measurement techniques down to 1.2ns pulses. We compare gated, STI and abutted tie diodes and introduce a…
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2006
2006
Reliability Issues in RF-MEMS Switches Submitted to Cycling and ESD Test
A. Tazzoli
,
V. Peretti
,
R. Gaddi
,
A. Gnudi
,
E. Zanoni
,
G. Meneghesso
IEEE International Reliability Physics Symposium…
2006
Corpus ID: 36416133
RF-MEMS switches have potential prerogatives better than traditional solid state devices, but the presence of mechanical movement…
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Highly Cited
2003
Highly Cited
2003
A MOSFET power supply clamp with feedback enhanced triggering for ESD protection in advanced CMOS technologies
Jeremy C. Smith
,
G. Boselli
Electrical Overstress/Electrostatic Discharge…
2003
Corpus ID: 10242923
2001
2001
On-chip ESD protection design by using polysilicon diodes in CMOS process
M. Ker
,
Tung-Yang Chen
,
Tai-Ho Wang
,
Chung-Yu Wu
IEEE J. Solid State Circuits
2001
Corpus ID: 14535622
A novel on-chip electrostatic discharge (ESD) protection design by using polysilicon diodes as the ESD clamp devices in CMOS…
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Highly Cited
1989
Highly Cited
1989
Scanning electrochemical microscopy. Apparatus and two-dimensional scans of conductive and insulating substrates
J. Kwak
,
A. Bard
1989
Corpus ID: 10719939
The applicatlon of scannlng electrochemical microscopy (SECM) in the feedback mode to two-dknenslonai scans over conductlve and…
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1968
1968
Transmission line pulse transformers—Theory and applications
R. Matick
1968
Corpus ID: 62346984
The advent of fast rise-time pulse techniques and their increasing importance brought on by high-speed microminiature circuits…
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