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Transmission-line pulse
Known as:
TLP
, Transmission line pulse
Transmission-Line Pulse (TLP) is a way to study integrated circuit technologies and circuit behavior in the current and time domain of electrostatic…
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Related topics
Related topics
1 relation
Integrated circuit
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2009
2009
Implementation of buffered Super-Junction LDMOS in a 0.18um BCD process
I. Park
,
Yong-Keon Choi
,
+7 authors
K. Yoo
International Symposium on Power Semiconductor…
2009
Corpus ID: 43180517
We experimentally demonstrate a Super-Junction LDMOS transistor in a 0.18 µm BCD technology. The buffered Super-Junction…
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2007
2007
A Kelvin transmission line pulsing system with optimized oscilloscope ranging
A. Gerdemann
,
K. Bhatia
,
E. Rosenbaum
Electrical Overstress/Electrostatic Discharge…
2007
Corpus ID: 8807007
In this work, a custom transmission line pulsing system is built using common laboratory equipment and off-the-shelf components…
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2007
2007
Transmission Line Pulse Stress on Thick Film Resistors
D. Bonfert
,
H. Wolf
,
H. Gieser
,
P. Svasta
,
A. Romanescu
,
E. Cazacu
Information Security Solutions Europe
2007
Corpus ID: 44013359
One of the most important issues of resistors properties is the value stability under different electrical and non electrical…
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2006
2006
Reliability Issues in RF-MEMS Switches Submitted to Cycling and ESD Test
A. Tazzoli
,
V. Peretti
,
R. Gaddi
,
A. Gnudi
,
E. Zanoni
,
G. Meneghesso
IEEE International Reliability Physics Symposium…
2006
Corpus ID: 36416133
RF-MEMS switches have potential prerogatives better than traditional solid state devices, but the presence of mechanical movement…
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2004
2004
Multilevel Transmission Line Pulse (MTLP) tester
T. Daenen
,
S. Thijs
,
M. I. Natarajan
,
V. Vassilev
,
V. De Heyn
,
G. Groeseneken
Electrical Overstress/Electrostatic Discharge…
2004
Corpus ID: 33668786
A novel TLP testing approach, multilevel TLP (MTLP), is described, which can yield accurate and comprehensive snapback IV…
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2003
2003
TLP systems with combined 50 and 500-ohm impedance probes and kelvin probes
E. Grund
,
R. Gauthier
Electrical Overstress/Electrostatic Discharge…
2003
Corpus ID: 21015610
TLP systems are mainly classified by their impedance, such as 50 ohm or 500 ohm current source. A new TLP configuration allows…
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2003
2003
Combined TLP/RF testing system for detection of ESD failures in RF circuits
S. Hyvonen
,
S. Joshi
,
E. Rosenbaum
Electrical Overstress/Electrostatic Discharge…
2003
Corpus ID: 21425900
We present a modified TLP measurement system in which full functional RF testing, along with conventional leakage current…
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2001
2001
Contributions to standardization of Transmission Line Pulse testing methodology
B. Keppens
,
V. De Heyn
,
M. Natarajan Iyer
,
G. Groeseneken
Electrical Overstress/Electrostatic Discharge…
2001
Corpus ID: 591593
When characterizing semiconductor components to determine their ESD robustness using a transmission line pulse test system, there…
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Highly Cited
1998
Highly Cited
1998
Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
Christian Russ
,
K. Bock
,
Mahmoud Rasras
,
I. D. Wolf
,
Guido Groeseneken
,
H. Maes
Electrical Overstress/ Electrostatic Discharge…
1998
Corpus ID: 31665902
The triggering of grounded gate nMOSFET (gg-nMOS) and field-oxide devices (FOXFETs), essential for optimized ESD protection…
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1968
1968
Transmission line pulse transformers—Theory and applications
R. Matick
1968
Corpus ID: 62346984
The advent of fast rise-time pulse techniques and their increasing importance brought on by high-speed microminiature circuits…
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