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Timing failure

Timing failure is a failure of a process, or part of a process, in a synchronous distributed system or real-time system to meet limits set on… 
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Related topics

Related topics

6 relations
Clock driftClock skewFailure semanticsProcess (computing)

Broader (1)

Real-time computing

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Reducing late-timing failure at scale:straggler root-cause analysis in cloud datacenters
Task stragglers hinder effective parallel job execution in Cloud datacenters, resulting in late-timing failures due to the… 
2013
2013
Low Complexity Joint Estimation of Synchronization Impairments in Sparse Channel for MIMO-OFDM System
2008
2008
Timing Failures Detection in Web Services
Current business critical environments increasingly rely on SOA standards to execute business operations. These operations are… 
2007
2007
An LLC-OCV Methodology for Statistic Timing Analysis
With further increase in chip size and shrink in device dimension, the influence of on chip semiconductor process variation can… 
2003
2003
Resource Management for the Real-Time Support of an Embedded Publish / Subscribe System
A new class of application can now be envisaged with the emergence of both mobile computing and ubiquitous computing… 
1999
1999
Real-time fault-tolerant atomic broadcast
We present algorithms for real-time fault-tolerant uniform atomic broadcast. We first design a distributed execution model for… 
1998
1998
Using light-weight groups to handle timing failures in quasi-synchronous systems
In a quasi-synchronous environment worst-case times associated with a given activity are usually much higher than the average… 
1998
1998
Diagnosis and characterization of timing-related defects by time-dependent light emission
Technological advances such as flip-chip packaging, multiple hierarchical wiring planes, and ultra-high frequencies reduce the… 
1993
1993
Scheduling Strategies for Periodic Tasks to avoid Timing Faults in Critical Control Systems
1983
1983
Latch-Up and Timing Failure Analysis of CMOS VLSI using Electron Beam Techniques
An electron beam testing system has been established for CMOS failure analysis. Problems studied include leakage, latch-up… 
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