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Thermal laser stimulation
Thermal laser stimulation represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor…
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Related topics
Related topics
3 relations
Electromigration
Failure analysis
Semiconductor device
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Ambient Temperature Thermally Induced Voltage Alteration for Identification of Defects in Superconducting Electronics
M. W. Jenkins
,
P. Tangyunyong
,
+8 authors
L. Johnson
ISTFA : Conference Proceedings from the 44th…
2018
Corpus ID: 139319156
As research in superconducting electronics matures, it is necessary to have failure analysis techniques to identify parameters…
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Review
2016
Review
2016
Electrical Homo-Junction Delineation Techniques: A Comparative Study
N. Vivet
,
M. Diogo
,
+4 authors
J. Rebrasse
2016
Corpus ID: 52213518
In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of…
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2015
2015
Investigation of interconnect layout on CU/Low-K TDDB reliability
Xing-Ong Ran
2015
Corpus ID: 115010439
2015
2015
Comparison of Magnetic Field Imaging and Thermal Laser Stimulation for Detecting Electrically Shorting Defects within a Die BEOL
Kevin A. Distelhurst
2015
Corpus ID: 114399222
2013
2013
Optimization of Parametric Defect Localization on Integrated Circuits
L. Saury
,
St-Ericsson
2013
Corpus ID: 3026752
"This PXI solution is now a key piece of equipment for the ST-Ericsson failure analysis laboratory. It can be used for all new…
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2005
2005
Thermal Laser Stimulation For MEMS characterisation and failure analysis from principles to case studies
P. Perdu
,
D. Briand
,
F. Beaudoin
,
X. Lafontan
2005
Corpus ID: 107654027
2002
2002
Thermal laser stimulation for direct localization of defects in integrated circuits
F. Beaudouin
,
R. Desplats
,
P. Perdu
2002
Corpus ID: 109670138