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Test vector

In computer science and engineering, a test vector is a set of inputs provided to a system in order to test that system.
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Related topics

Related topics

9 relations
All-pairs testingBoundary-value analysisComputable functionComputer science

Broader (1)

Computer engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Review
2006
Review
2006
Survey of Test Vector Compression Techniques
Test data compression consists of test vector compression on the input side and response, compaction on the output side. This… 
Highly Cited
2005
Highly Cited
2005
On low-capture-power test generation for scan testing
Research on low-power scan testing has been focused on the shift mode, with little or no consideration given to the capture mode… 
Highly Cited
2005
Highly Cited
2005
X-filter: filtering unknowns from compacted test responses
Using off-the-shelf error correcting codes for compacting test response (Patel, 2003) is attractive because it provides multiple… 
Highly Cited
2003
Highly Cited
2003
An efficient test vector compression scheme using selective Huffman coding
This paper presents a compression/decompression scheme based on selective Huffman coding for reducing the amount of test data… 
2002
2002
Scan power reduction through test data transition frequency analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of… 
Highly Cited
2000
Highly Cited
2000
Test data compression for system-on-a-chip using Golomb codes
We present a new test data compression method and decompression architecture based on Golomb codes. The proposed method is… 
Highly Cited
1999
Highly Cited
1999
Resistive bridge fault modeling, simulation and test generation
In this work/sup 1/ we develop models of resistive bridging faults and study the fault coverage on ISCAS85 circuits of different… 
Highly Cited
1998
Highly Cited
1998
Test vector decompression via cyclical scan chains and its application to testing core-based designs
  • A. JasN. Touba
  • Proceedings International Test Conference (IEEE…
  • 1998
  • Corpus ID: 13619855
A novel test vector compression/decompression technique is proposed for reducing the amount of test data that must be stored on a… 
Highly Cited
1998
Highly Cited
1998
Design for testability of embedded integrated operational amplifiers
The operational amplifier (op amp) is one of the most encountered analog building blocks. In this paper, the problem of testing… 
Highly Cited
1989
Highly Cited
1989
CMOS IC stuck-open-fault electrical effects and design considerations
The authors evaluate CMOS IC stuck-open-fault electrical effects, including voltage levels, quiescent power supply current (I/sub… 
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