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Test vector

In computer science and engineering, a test vector is a set of inputs provided to a system in order to test that system.
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Related topics

Related topics

9 relations
All-pairs testingBoundary-value analysisComputable functionComputer science

Broader (1)

Computer engineering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
A packet address driven test strategy for stuck-at faults in networks-on-chip interconnects
With the rapid advancements of deep submicron and nano technologies the dimension of a chip is ever shrinking. With continuous… 
2008
2008
Single-Measurement Diagnostic Test Method for Parametric Faults of I/Q Modulating RF Transceivers
This paper presents a loop-back method for quadrature modulation transceiver circuits to diagnose parametric faults of the system… 
2008
2008
Polymorphic Gates in Design and Test of Digital Circuits
A rolling-bearing-mounted linear guiding unit comprising a hardened and polished guide rail on which rolling element raceways are… 
2007
2007
Particle swarm-based optimal partitioning algorithm for combinational CMOS circuits
2002
2002
Scan power reduction through test data transition frequency analysis
Significant reductions in test application times can be achieved through parallelizing core tests; however, simultaneous test of… 
2002
2002
Timed test generation for crosstalk switch failures in domino CMOS
As technology scales into the deep submicron regime, capacitive coupling between signal lines becomes a dominant problem… 
1999
1999
Automatic test case generation from requirements specifications for real-time embedded systems
This paper presents continuing research toward automatic generation of test cases from requirements specifications for event… 
1997
1997
Using Partial Isolation Rings to Test Core-Based Designs
A partial isolation ring provides the same fault coverage as a full isolation ring but avoids adding multiplexers on critical… 
1992
1992
Fast adaptive search algorithm for vector quantization by progressive codebook arrangement
1989
1989
Test pattern generation for circuits with tri-state modules by Z-algorithm
An algorithmic test pattern generation method named ZALG* for circuits including tri-state modules that have been extensively… 
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