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Stress testing (software)

Known as: Stress test, Stress test (software) 
Stress testing is a software testing activity that determines the robustness of software by testing beyond the limits of normal operation. Stress… 
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Related topics

Related topics

31 relations
Branch (computer science)CHESS model checkerCode coverageConcurrency (computer science)

Papers overview

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Highly Cited
2015
Highly Cited
2015
A Top-down Approach to Stress-testing Banks
We propose a simple, parsimonious, and easily implementable method for stress-testing banks using a top-down approach that… 
Highly Cited
2013
Highly Cited
2013
Framework for smart city applications based on participatory sensing
Smart cities offer services to their inhabitants which make everyday life easier beyond providing a feedback channel to the city… 
Highly Cited
2007
Highly Cited
2007
Statistical Pattern Recognition and Built-in Reliability Test for Feature Extraction and Health Monitoring of Electronics Under Shock Loads
The built-in stress test (BIST) is extensively used for diagnostics or identification of failure. The current version of BIST… 
Highly Cited
2007
Highly Cited
2007
Electrically Bistable Thin-Film Device Based on PVK and GNPs Polymer Material
We present an electrical-bistability device based on MIM-sandwiched structure. Poly(N-vinylcarbazole) (PVK) mixed with gold… 
Highly Cited
2006
Highly Cited
2006
Stress-Induced Martensitic Phase Transformation in Intermetallic Nickel Aluminum Nanowires
Atomistic simulations are utilized to demonstrate a stress-induced martensitic phase transformation in intermetallic nickel… 
2004
2004
Mercuric iodide medical imagers for low-exposure radiography and fluoroscopy
Photoconductive polycrystalline mercuric iodide deposited on flat panel thin film transistor (TFT) arrays is being developed for… 
Highly Cited
2002
Highly Cited
2002
Characterization and adaptive filtering of motion artifacts in pulse oximetry using accelerometers
Noise, in the form of motion artifact, often leads to false information and acts as a limiting factor in the analysis of pulse… 
Highly Cited
1996
Highly Cited
1996
Trapped charge modulation: a new cause of instability in AlGaAs/InGaAs pseudomorphic HEMT's
A new degradation mechanism of PM-HEMT's subsequent to hot electron stress tests or high temperature storage tests is presented… 
Review
1993
Review
1993
An Overview of the SPHINX-II Speech Recognition System
In the past year at Carnegie Mellon steady progress has been made in the area of acoustic and language modeling. The result has… 
Highly Cited
1988
Highly Cited
1988
Stress. Development and functions of a critical incident stress debriefing team.
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