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Software bug
Known as:
Bug triage
, Steps To Reproduce
, Programming error
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A software bug is an error, flaw, failure or fault in a computer program or system that causes it to produce an incorrect or unexpected result, or to…
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Related topics
Related topics
50 relations
2001: A Space Odyssey
Arbitrary code execution
Arithmetic underflow
Artifact (software development)
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
1991
Highly Cited
1991
Experimental evidence for excitonic mechanism of defect generation in high-purity silica.
Tsai Te
,
Griscom Dl
1991
Corpus ID: 121376724
Direct evidence for the creation of oxygen-vacancy, oxygen-interstitial pairs in SiO 2 glasses by an excitonic mechanism is…
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Highly Cited
1990
Highly Cited
1990
Formation of arsenic precipitates in GaAs buffer layers grown by molecular beam epitaxy at low substrate temperatures
M. Melloch
,
N. Ōtsuka
,
J. Woodall
,
A. C. Warren
,
J. Freeouf
1990
Corpus ID: 96007064
We have grown film structures by molecular beam epitaxy which include GaAs buffer layers grown at low substrate temperatures (250…
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Highly Cited
1990
Highly Cited
1990
Nitrogen-defect aggregation characteristics of some Australasian diamonds; time-temperature constraints on the source regions of pipe and alluvial diamonds
W. Taylor
,
A. Jaques
,
M. Ridd
1990
Corpus ID: 99073057
Review
1989
Review
1989
Knowledge Programming in Loops: Report on an Experimental Course
M. Stefik
,
D. Bobrow
,
S. Mittal
,
L. Conway
The AI Magazine
1989
Corpus ID: 2712977
Early this year fifty people took an experimental course at Xerox PARC on knowledge programming in Loops During the course, they…
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Highly Cited
1987
Highly Cited
1987
Electrical and physical characteristics of thin nitrided oxides prepared by rapid thermal nitridation
T. Hori
,
Hiroshi Iwasaki
,
Y. Naito
,
H. Esaki
IEEE Transactions on Electron Devices
1987
Corpus ID: 20007190
Ultrathin oxides (5-12 nm) were nitrided by lamp-heated rapid thermal annealing in ammonia at temperatures of 900-1150°C for 5…
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Highly Cited
1985
Highly Cited
1985
Time-dependent-dielectric breakdown of thin thermally grown SiO2films
K. Yamabe
,
Kenji Taniguchi
IEEE Transactions on Electron Devices
1985
Corpus ID: 46474808
To evaluate the reliability of thin thermally grown oxide films, we investigated both step stress breakdown and time-dependent…
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Highly Cited
1981
Highly Cited
1981
Lattice Defects in Semiconducting Hg1 − x Cd x Te Alloys I . Defect Structure of Undoped and Copper Doped
H. Vydyanath
1981
Corpus ID: 93735386
Undoped crystals were subjected to high temperature equilibration at temperatures ranging from 400° to 655°C in various Hg…
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Highly Cited
1974
Highly Cited
1974
Applying a composite model to the IC yield problem
R. M. Warner
1974
Corpus ID: 62540110
The defect density within an integrated circuit slice often exhibits gross variations from area to area. The density may vary…
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Highly Cited
1957
Highly Cited
1957
The Embryology of Cortisone-induced Cleft Palate
B. Walker
,
F. Fraser
1957
Corpus ID: 19502861
In the past, the sporadic, unpredictable occurrence of cleft palate made the study of its embryological origins difficult. The…
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Highly Cited
1940
Highly Cited
1940
Textbook of Biochemistry
A. White
The Yale Journal of Biology and Medicine
1940
Corpus ID: 83175815
This book was originally written as a biochemistry textbook for medical, dental, agricultural, and general college students. The…
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