Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 226,184,855 papers from all fields of science
Search
Sign In
Create Free Account
Software bug
Known as:
Bug triage
, Steps To Reproduce
, Programming error
Expand
A software bug is an error, flaw, failure or fault in a computer program or system that causes it to produce an incorrect or unexpected result, or to…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
50 relations
2001: A Space Odyssey
Arbitrary code execution
Arithmetic underflow
Artifact (software development)
Expand
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
1997
Highly Cited
1997
Magnetic Tunneling Applied to Memory (Invited)
J. Daughton
1997
Corpus ID: 49474449
Random access magnetoresistive memories have been designed using anisotropic magnetoresistive (AMR) material and more recently…
Expand
Highly Cited
1997
Highly Cited
1997
Room-temperature continuous-wave lasing from stacked InAs/GaAs quantum dots grown by metalorganic chemical vapor deposition
F. Heinrichsdorff
,
M.-H. Mao
,
+4 authors
P. Werner
1997
Corpus ID: 26892541
We report on quantum dot (QD) lasers made of stacked InAs dots grown by metalorganic chemical vapor deposition. Successful growth…
Expand
Highly Cited
1997
Highly Cited
1997
Mechanism of and Defect Formation in the Self-Assembly of Polymeric Polycation−Montmorillonite Ultrathin Films
N. Kotov
,
T. Haraszti
,
+4 authors
J. Fendler
1997
Corpus ID: 53677273
Positively charged polydiallyldimethylammonium chloride, P, was found to bind strongly to the surface of anionic montmorrillonite…
Expand
Highly Cited
1990
Highly Cited
1990
Formation of arsenic precipitates in GaAs buffer layers grown by molecular beam epitaxy at low substrate temperatures
M. Melloch
,
N. Ōtsuka
,
J. Woodall
,
A. C. Warren
,
J. Freeouf
1990
Corpus ID: 96007064
We have grown film structures by molecular beam epitaxy which include GaAs buffer layers grown at low substrate temperatures (250…
Expand
Highly Cited
1984
Highly Cited
1984
Functional Testing of Microprocessors
Dhananjay Brahme
,
J. Abraham
IEEE transactions on computers
1984
Corpus ID: 20655425
This paper presents a new and systematic method to generate tests for microprocessors. A functional level model for the…
Expand
Highly Cited
1983
Highly Cited
1983
Integrated circuit yield statistics
Charles
,
Stapper
,
Senior Member
,
Frederick
,
Armstrong
Proceedings of the IEEE
1983
Corpus ID: 37843230
The random failure statistics for the yield of mass-produced semiconductor integrated circuits are derived by considering defect…
Expand
Highly Cited
1976
Highly Cited
1976
Defective excision repair of γ-ray-damaged DNA in human (ataxia telangiectasia) fibroblasts
M. C. Paterson
,
B. P. Smith
,
P. Lohman
,
A. K. Anderson
,
L. Fishman
Nature
1976
Corpus ID: 4167330
ATAXIA telangiectasia (AT) (Louis–Bar syndrome) is a rare human neurovascular disease displaying an autosomal recessive pattern…
Expand
Highly Cited
1971
Highly Cited
1971
Fault Equivalence in Combinational Logic Networks
E. McCluskey
,
Frederick W. Clegg
IEEE transactions on computers
1971
Corpus ID: 206618318
This paper is a study of the effects of faults on the logical operation of combinational (acyclic) logic circuits. In particular…
Expand
Highly Cited
1966
Highly Cited
1966
On Finding a Nearly Minimal Set of Fault Detection Tests for Combinational Logic Nets
D. Armstrong
IEEE Transactions on Electronic Computers
1966
Corpus ID: 35847628
A procedure is described for finding, by shortcut methods, a near-minimal set of tests for detecting all single faults in a…
Expand
Highly Cited
1940
Highly Cited
1940
Textbook of Biochemistry
Abraham White
The Yale Journal of Biology and Medicine
1940
Corpus ID: 83175815
This book was originally written as a biochemistry textbook for medical, dental, agricultural, and general college students. The…
Expand
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE