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Shift Register Device Component

Known as: Shift Register 
An electronic circuit designed to move all data to the left or right, thereby doing multiplication, division, or parallel conversion.
National Institutes of Health

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Medical Device Component or Accessory

Papers overview

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Highly Cited
2012
Highly Cited
2012
Shift registers based on magnetic domain wall ratchets with perpendicular anisotropy.
The movement of magnetic domain walls can be used to build a device known as a shift register, which has applications in memory… 
Highly Cited
2011
Highly Cited
2011
Transparent Flexible Circuits Based on Amorphous-Indium–Gallium–Zinc–Oxide Thin-Film Transistors
Circuits implemented with high-performance amorphous-indium-gallium-zinc-oxide thin-film transistors (TFTs) are realized on… 
Highly Cited
2008
Highly Cited
2008
Current-Controlled Magnetic Domain-Wall Nanowire Shift Register
The controlled motion of a series of domain walls along magnetic nanowires using spin-polarized current pulses is the essential… 
Highly Cited
2004
Highly Cited
2004
On The Shift Register Sequences
In this paper, we use firstly the method of complex and functional analysis in mathematics to obtain the vector-valued expression… 
Highly Cited
2002
Highly Cited
2002
Submicrometer Ferromagnetic NOT Gate and Shift Register
An all-metallic submicrometer device is demonstrated experimentally at room temperature that performs logical NOT operations on… 
Highly Cited
2002
Highly Cited
2002
Efficient Design of Event-Related fMRI Experiments Using M-Sequences
Rapid event-related fMRI (erfMRI) allows estimation of the shape of hemodynamic responses (HDR) associated with transient brain… 
Highly Cited
2001
Highly Cited
2001
Clocking of molecular quantum-dot cellular automata
Quantum-dot cellular automata (QCA) may provide a novel way to bypass the transistor paradigm to form ultrasmall computing… 
Highly Cited
1993
Highly Cited
1993
Near Shannon limit error-correcting coding and decoding: Turbo-codes. 1
A new class of convolutional codes called turbo-codes, whose performances in terms of bit error rate (BER) are close to the… 
Review
1985
Review
1985
Built-In Self-Test Techniques
  • E. McCluskey
  • IEEE Design & Test of Computers
  • 1985
  • Corpus ID: 20949409
A system that includes self-test features must have facilities for generating test patterns and analyzing the resultant circuit… 
Review
1980
Review
1980
Crosscorrelation properties of pseudorandom and related sequences
Binary maximal-length linear feedback shift register sequences (m-sequences) have been successfully employed in communications… 
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