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Sequential logic
Known as:
Sequential logic circuit
, Clocked sequential system
, Clocked sequential systems
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In digital circuit theory, sequential logic is a type of logic circuit whose output depends not only on the present value of its input signals but on…
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Related topics
Related topics
40 relations
And-inverter graph
Application-specific integrated circuit
Arithmetic logic unit
Asynchronous circuit
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Broader (2)
Digital electronics
Logic in computer science
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2001
2001
Functional decomposition with an efficient input support selection for sub-functions based on information relationship measures
M. Rawski
,
L. Józwiak
,
T. Luba
Journal of systems architecture
2001
Corpus ID: 23681294
1996
1996
Random pattern testing for sequential circuits revisited
L. Nachman
,
K. Saluja
,
S. Upadhyaya
,
R. Reuse
Proceedings of Annual Symposium on Fault Tolerant…
1996
Corpus ID: 16804075
Random pattern testing methods are known to result in poor fault coverage for most sequential circuits unless costly circuit…
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Highly Cited
1994
Highly Cited
1994
Application of simple genetic algorithms to sequential circuit test generation
E. Rudnick
,
J. Holm
,
D. Saab
,
J. Patel
Proceedings of European Design and Test…
1994
Corpus ID: 13140902
In this work we investigate the effectiveness of genetic algorithms (GAs) in the test generation process. We use simple GAs to…
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Highly Cited
1992
Highly Cited
1992
HOPE: an efficient parallel fault simulator
H. K. Lee
,
Dong Sam Ha
[] Proceedings 29th ACM/IEEE Design Automation…
1992
Corpus ID: 58690153
The authors present an efficient sequential circuit parallel fault simulator, HOPE, which simulates 32 faults at a time. HOPE is…
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Highly Cited
1989
Highly Cited
1989
Sequential Circuit Test Generator (STG) benchmark results
W.-T. Cheng
,
S. Davidson
IEEE International Symposium on Circuits and…
1989
Corpus ID: 56964177
The authors report on the results of running a version of the Sequential Circuit Test Generator (STG3) on the ISCAS-89 sequential…
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Highly Cited
1988
Highly Cited
1988
An incomplete scan design approach to test generation for sequential machines
Hi-Keung Tony Ma
,
S. Devadas
,
Richard Newton
,
Albert 0 Sangiovanni-Vincentelli
International Test Conference Proceeding@m_New…
1988
Corpus ID: 5297352
An incomplete scan design approach to sequential test generation is presented. This approach represents a significant departure…
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Highly Cited
1988
Highly Cited
1988
SPLIT circuit model for test generation
W.-T. Cheng
25th ACM/IEEE, Design Automation Conference…
1988
Corpus ID: 17781797
A novel circuit model, SPLIT, is presented which is a modified 9-valued circuit model. SPLIT has the precision of the 9-valued…
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Highly Cited
1985
Highly Cited
1985
A Sequential Circuit Test Generation System
S. Mallela
,
Shianling Wu
International Test Conference
1985
Corpus ID: 41326628
Highly Cited
1981
Highly Cited
1981
Automatic Test Generation for Stuck-Open Faults in CMOS VLSI
Y.M. Elzig
Design Automation Conference
1981
Corpus ID: 637076
Because of its relative low power dissipation, intermediate speed, and high density, CMOS (Complementary Metal Oxide…
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Highly Cited
1963
Highly Cited
1963
A State Variable Assignment Method for Asynchronous Sequential Switching Circuits
N. C.
,
LIu
,
Yorktown Heights
JACM
1963
Corpus ID: 12816872
A b.~tract. This paper describes a method of state variable assignment for asynchronous sequential switching circuits. The method…
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