Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 228,600,547 papers from all fields of science
Search
Sign In
Create Free Account
Pyrometer Device Component
Known as:
Pyrometer
A device designed to measure high temperatures, such as those in a furnace.
National Institutes of Health
Create Alert
Alert
Related topics
Related topics
2 relations
Gauge or Meter Device Component
Thermometer, device
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2005
2005
Investigation of plasma sprayed coatings formation by visualization of droplet impact and splashing on a smooth substrate
J. Cédelle
,
M. Vardelle
,
B. Pateyron
,
P. Fauchais
IEEE Transactions on Plasma Science
2005
Corpus ID: 12770053
In plasma spraying, individual droplet behavior at impact with the substrate is the fundamental element in understanding of…
Expand
2003
2003
Nanoweb Formation: 2D Self‐Assembly of Semiconductor Gallium Oxide Nanowires/Nanotubes
U. Graham
,
Shashank Sharma
,
M. Sunkara
,
Burtron H. Davis
2003
Corpus ID: 17339025
This paper reports a method to produce networks of crystalline gallium oxide comprised of one‐dimensional (1D) nanostructures…
Expand
Highly Cited
1995
Highly Cited
1995
Methyl radical measurement by cavity ring-down spectroscopy
P. Zalicki
,
Y. Ma
,
+4 authors
C. Kruger
1995
Corpus ID: 85503338
1994
1994
Growth Rate and Characterization of Silicon Oxide Films Grown in N 2 O Atmosphere in a Rapid Thermal Processor
P. Lange
,
H. Bernt
,
E. Hartmannsgruber
,
F. Naumann
1994
Corpus ID: 27391438
A rapid thermal oxidation process of silicon in N20 ambient was investigated using a commercially available reactor with a fixed…
Expand
1994
1994
Measurement of solid–liquid interface temperature during pulsed excimer laser melting of polycrystalline silicon films
Xianfan Xu
,
C. Grigoropoulos
,
R. Russo
1994
Corpus ID: 123416951
A nanosecond time resolution pyrometer has been developed for measuring the transient temperature of thin polycrystalline silicon…
Expand
1991
1991
Emissivity of silicon wafers during rapid thermal processing
P. Vandenabeele
,
K. Maex
Other Conferences
1991
Corpus ID: 135526683
The emissivity of silicon wafers was measured for two specfic conditions. Firstly the emissivity of silicon wafers below 700 C…
Expand
1989
1989
Determination of the melting point and the emissivity of refractory metals with a six-wavelength pyrometer
J. Hiernaut
,
F. Sakuma
,
C. Ronchi
1989
Corpus ID: 92861605
1986
1986
Determination of the melting point and of the spectral and total emissivities of tungsten, tantalum, and molybdenum in the solid and liquid states with a six-wavelength pyrometer
J. Hiernaut
,
R. Beukers
,
M. Hoch
,
T. Matsui
,
R. W. Ohse
1986
Corpus ID: 102450475
Highly Cited
1979
Highly Cited
1979
Three-wavelength pyrometer for measuring flame temperatures.
K. Cashdollar
Applied Optics
1979
Corpus ID: 41582811
This paper describes a pyrometer that measures the continuum radiation from particles in a flame or explosion at three…
Expand
1963
1963
Phase Equilibrium Relations in the Sc2O3-Ga2O3 System
S. Schneider
,
J. Waring
Journal of Research of the National Bureau of…
1963
Corpus ID: 96694968
The phase equilibrium diagram was determined for the Sc2O3-Ga2O3 system. A quenching furnace, wound with 60 percent Pt—40 percent…
Expand
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE