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Pyrometer Device Component
Known as:
Pyrometer
A device designed to measure high temperatures, such as those in a furnace.
National Institutes of Health
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Related topics
Related topics
2 relations
Gauge or Meter Device Component
Thermometer, device
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
Fast fiber-optic multi-wavelength pyrometer.
T. Fu
,
Peng Tan
,
C. Pang
,
Huan Zhao
,
Yi Shen
Review of Scientific Instruments
2011
Corpus ID: 26167633
A fast fiber-optic multi-wavelength pyrometer was developed for the ultraviolet-visible-near infrared spectra from 200 nm to 1700…
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2005
2005
Investigation of plasma sprayed coatings formation by visualization of droplet impact and splashing on a smooth substrate
J. Cédelle
,
M. Vardelle
,
B. Pateyron
,
P. Fauchais
IEEE Transactions on Plasma Science
2005
Corpus ID: 12770053
In plasma spraying, individual droplet behavior at impact with the substrate is the fundamental element in understanding of…
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2003
2003
Nanoweb Formation: 2D Self‐Assembly of Semiconductor Gallium Oxide Nanowires/Nanotubes
U. Graham
,
Shashank Sharma
,
M. Sunkara
,
Burtron H. Davis
2003
Corpus ID: 17339025
This paper reports a method to produce networks of crystalline gallium oxide comprised of one‐dimensional (1D) nanostructures…
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Highly Cited
1999
Highly Cited
1999
Effect of Batter Solids and Starch Type on the Structure of Baked Starch Foams
J. Lawton
,
R. Shogren
,
K. Tiefenbacher
1999
Corpus ID: 34723278
ABSTRACT The effects of starch type on the properties of baked starch foams were investigated. Starch types used for baking were…
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1997
1997
Broadband coherent anti-Stokes Raman spectroscopy with a modeless dye laser.
J. Hahn
,
Chul-Woung Park
,
Seung-Nam Park
Applied Optics
1997
Corpus ID: 29069057
We develop a modeless dye laser for broadband coherent anti-Stokes Raman spectroscopy (CARS) and investigate the operational…
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Highly Cited
1995
Highly Cited
1995
Methyl radical measurement by cavity ring-down spectroscopy
P. Zalicki
,
Y. Ma
,
+4 authors
C. Kruger
1995
Corpus ID: 85503338
1994
1994
Growth Rate and Characterization of Silicon Oxide Films Grown in N 2 O Atmosphere in a Rapid Thermal Processor
P. Lange
,
H. Bernt
,
E. Hartmannsgruber
,
F. Naumann
1994
Corpus ID: 27391438
A rapid thermal oxidation process of silicon in N20 ambient was investigated using a commercially available reactor with a fixed…
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1991
1991
Emissivity of silicon wafers during rapid thermal processing
P. Vandenabeele
,
K. Maex
Other Conferences
1991
Corpus ID: 135526683
The emissivity of silicon wafers was measured for two specfic conditions. Firstly the emissivity of silicon wafers below 700 C…
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1989
1989
Determination of the melting point and the emissivity of refractory metals with a six-wavelength pyrometer
J. Hiernaut
,
F. Sakuma
,
C. Ronchi
1989
Corpus ID: 92861605
Highly Cited
1979
Highly Cited
1979
Three-wavelength pyrometer for measuring flame temperatures.
K. Cashdollar
Applied Optics
1979
Corpus ID: 41582811
This paper describes a pyrometer that measures the continuum radiation from particles in a flame or explosion at three…
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