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Gauge or Meter Device Component
Known as:
Gauge or Meter
, Gauges/Meters
, Meter
A device designed to give a visual indication of the condition of a system.
National Institutes of Health
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Related topics
Related topics
16 relations
Altimeter Device Component
Bolometer Device Component
Densitometer Device Component
Flowmeter Device Component
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
UNCERTAINTIES OF THE 137 Cs TECHNIQUE FOR VALIDATION OF SOIL REDISTRIBUTION MODELLING IN A SEMIARID MESOSCALE WATERSHED
P. Medeiros
,
J. C. Araújo
,
A. Andrello
2014
Corpus ID: 52831292
Scarcity of long-term series of sediment-related variables has led watershed managers to apply mathematical models to simulate…
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2012
2012
Abstract Submitted for the SHOCK09 Meeting of The American Physical Society Calibration of Wire-Like Manganin Gauges for Use in Planar Shock-Wave Experiments
D. Chapman
,
W. Proud
2012
Corpus ID: 110651080
Submitted for the SHOCK09 Meeting of The American Physical Society Calibration of Wire-Like Manganin Gauges for Use in Planar…
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2011
2011
Accounting for Spatiotemporal Variation of Rainfall Measurements when Evaluating Ground-Based Methods of Weather Modification
S. Beare
,
R. Chambers
,
S. Peak
,
Jennifer M. Ring
2011
Corpus ID: 6910306
Weather modification trials tends to rely on radomized experimental designs. Unfortunately, these designs have so far not…
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2008
2008
Autodyne Sensors of the EHF Range on Gunn Diodes
S. Votoropin
European Microwave Conference
2008
Corpus ID: 32770879
Radio wave autodyne gauges due to their non-contact, remote action and high accuracy of the diversified measurements performance…
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Review
2007
Review
2007
Nuclear techniques for peaceful development Radioisotopes and radiation technology in industry
J. Guizerix
,
V. Marković
,
P. Airey
2007
Corpus ID: 46405225
Industrial radiation processing is based on the use of radiation as a source of energy to induce specific chemical, physical, and…
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2006
2006
Evaluation of Residual Stress in Semiconductor Chips during Resin-Molding Process Using Piezoresistive Test Chips and a Finite Element Analysis Method
M. Koganemaru
,
T. Ikeda
,
N. Miyazaki
2006
Corpus ID: 111716674
The high residual stress generated on the surface of a semiconductor chip during the assembly of a resin-molded electronic…
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Review
2001
Review
2001
Methodological survey of the dioxin deposition measurement with bergerhoff gauges
M. Desmedt
,
E. Roekens
,
R. D. Fre
,
W. Swaans
,
G. Vanermen
2001
Corpus ID: 99981544
For a period of 30 ± 3 days samples were collected in Bergerhoff deposition gauges, as described in the German VDI 2090/1 Entwurf…
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1999
1999
Calibration of manganin pressure gauges at 250 C
J. Forbes
,
F. Garcia
,
C. Tarver
,
P. A. Uttiew
1999
Corpus ID: 136169527
During the past several decades manganin gauges have been used extensively for making in-situ high pressure measurements in…
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1990
1990
Gauge dependence of the eta function in Chern-Simons field theory and the Vilkovisky-DeWitt correction.
Birmingham
,
Cho
,
Kantowski
,
Rakowski
Physical Review D, Particles and fields
1990
Corpus ID: 6167703
We use two one-parameter families of gauges to demonstrate the gauge dependence of {eta}(0) for quantized pure Chern-Simons field…
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1989
1989
Canonical formalism and the Leibbrandt-Mandelstam prescription for noncovariant gauges.
Burnel
Physical Review D, Particles and fields
1989
Corpus ID: 2591643
A very simple and elegant approach to the Leibbrandt-Mandelstam regularization is given within the canonical formalism. For any…
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