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Product binning
Known as:
Binning
In semiconductor device fabrication, product binning is the categorizing of finished products based on their thermal and frequency characteristics.
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11 relations
Central processing unit
Clock rate
Computer memory
GeForce
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
Context Selection for Embedding Models
Li-Ping Liu
,
Francisco J. R. Ruiz
,
S. Athey
,
D. Blei
Neural Information Processing Systems
2017
Corpus ID: 38279642
Word embeddings are an effective tool to analyze language. They have been recently extended to model other types of data beyond…
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2015
2015
Development of resonant tunnelling diode terahertz emitter
K. Jacobs
2015
Corpus ID: 109763883
This thesis reports on the development of high current density InGaAs/AlAs/InP resonant tunnelling diodes (RTDs) grown by metal…
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2014
2014
How Minimal are MapReduce Arrangements for Binning Expressions
Ravinder PrakashG
,
K. M.
2014
Corpus ID: 62225921
intention of MapReduce Sets for Binning expressions analysis has to suggest criteria how Binning expressions in Binning data can…
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2010
2010
Active Harmonic Load-Pull With Realistic Wideband Communications Signals
N. Corporatio
,
M. Ury
,
M. Icrowav
2010
Corpus ID: 189892937
A new wideband open-loop active harmonic load–pull measurement approach is presented. The proposed method is based on wideband…
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2008
2008
On the secrecy rate region for the interference channel
O. O. Koyluoglu
,
H. E. Gamal
IEEE International Symposium on Personal, Indoor…
2008
Corpus ID: 1726001
This paper studies interference channels with security constraints. The existence of an external eavesdropper in a two-user…
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2006
2006
Plasma Moments in the environment of Mars Mars Express ASPERA-3 Observations
M. Fränz
,
E. Dubinin
,
+7 authors
R. Lundin
2006
Corpus ID: 55247366
Abstract We present the first electron and ion moment maps (density, ve locity and temperature) of the martian plasma environment…
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2001
2001
Burn-in failures and local region yield: an integrated field-reliability model
T. S. Barnett
,
A. Singh
,
V. Nelson
Proceedings 19th IEEE VLSI Test Symposium. VTS
2001
Corpus ID: 20472635
Defects have long been known to cluster on semiconductor wafers. Recent research has shown that this fact may be exploited to…
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Highly Cited
1999
Highly Cited
1999
Effectiveness of current farming systems in the control of dryland salinity
G. Walker
,
M. Gilfedder
,
J. Williams
1999
Corpus ID: 67795771
Highly Cited
1998
Highly Cited
1998
submitted to the Astrophysical Journal Evidence for a massive BH in the S0 galaxy NGC 4342
1998
Corpus ID: 8930352
1997
1997
A variation on local linear regression
M. C. Jones
1997
Corpus ID: 55151442
There has been much justifiable recent interest in local polynomial regression, and in particular in its local linear special…
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