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Process corners

Known as: OCV, On-chip variation 
In semiconductor manufacturing, a process corner is an example of a design-of-experiments (DoE) technique that refers to a variation of fabrication… 
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2012
Highly Cited
2012
Electron-spin based data storage for on-chip memories has the potential for ultrahigh density, low power consumption, very high… 
2012
2012
This paper presents an ultra-low-power, low-voltage frequency synthesizer designed for medical implantable devices. Several… 
2012
2012
A method for estimating battery state-of-function (SOF) is presented with a mathematical probabilistic statement within the… 
2011
2011
This paper proposes a SOC (State-of-charge) estimator of batteries using the Extended Kalman Filter (EKF). EKF can work properly… 
Highly Cited
2010
Highly Cited
2010
We present a design technique for (near) subthreshold operation that achieves ultra low energy dissipation at throughputs of up… 
2010
2010
This paper proposes a low-power remote frequency calibration method for passive UHF wireless transponders. The frequency of the… 
Highly Cited
2009
Highly Cited
2009
We present an automatic register placement technique that enables the synthesis of low-power clock trees for low-power ICs. On 7… 
Highly Cited
2008
Highly Cited
2008
With a widespread increase in the number of mobile wireless systems and applications, the need for location aware services has…