Process corners

Known as: OCV, On-chip variation 
In semiconductor manufacturing, a process corner is an example of a design-of-experiments (DoE) technique that refers to a variation of fabrication… (More)
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Papers overview

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2016
2016
Buffer insertion to remove hold violations at multiple process corners is addressed for the first time. The problem is formulated… (More)
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Highly Cited
2013
Highly Cited
2013
Battery state of health (SOH) monitoring has become a crucial challenge in hybrid electric vehicles (HEVs) and all electric… (More)
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Highly Cited
2012
Highly Cited
2012
Gating of the clock signal in VLSI chips is nowadays a mainstream design methodology for reducing switching power consumption. In… (More)
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Highly Cited
2011
Highly Cited
2011
Battery state of charge (SOC) is a critical parameter for the control of propulsion systems in plug-in hybrid electric vehicles… (More)
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Highly Cited
2011
Highly Cited
2011
Battery monitoring is vital for most electric vehicles (EVs), because the safety, operation, and even the life of the passenger… (More)
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Highly Cited
2008
Highly Cited
2008
With a widespread increase in the number of mobile wireless systems and applications, the need for location aware services has… (More)
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Highly Cited
2007
Highly Cited
2007
Process variations will greatly impact the stability, leakage power consumption, and performance of future microprocessors. These… (More)
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Highly Cited
2005
Highly Cited
2005
In sub-100-nm processes, many physical phenomena have become critical issues in the development of processes, devices, and… (More)
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2005
2005
Suppressing the leakage current in memories is critical in low-power design. By reducing the standby supply voltage (VDD) to its… (More)
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2002
2002
For the design of integrated circuits it is important to simulate the behaviour of the circuits quickly and realistically. We… (More)
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