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Process corners

Known as: OCV, On-chip variation 
In semiconductor manufacturing, a process corner is an example of a design-of-experiments (DoE) technique that refers to a variation of fabrication… 
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
  • S. Herdjunanto
  • 2016
  • Corpus ID: 24683006
Many research topics related to a battery such as fault detection and estimation have been shown for more than a decade since a… 
2015
2015
In this paper, we present a closed-form solution to the problem of optimally charging a Li-ion battery. The objective function is… 
2012
2012
This paper presents an ultra-low-power, low-voltage frequency synthesizer designed for medical implantable devices. Several… 
Review
2011
Review
2011
A state of charge estimation method for lithium ion batteries is presented. First, the problem is formulated, and existing… 
2010
2010
This paper proposes a low-power remote frequency calibration method for passive UHF wireless transponders. The frequency of the… 
Highly Cited
2008
Highly Cited
2008
With a widespread increase in the number of mobile wireless systems and applications, the need for location aware services has… 
2005
2005
In this paper, a 1.8 V 3.2 /spl mu/W comparator is presented. It features a hybrid offset compensation scheme and achieves over…