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Oscillator linewidth

The concept of a linewidth is borrowed from laser spectroscopy. The linewidth of a laser is a measure of its phase noise. The spectrogram of a laser… 
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Oscillator phase noisePhase noiseWhite noise

Papers overview

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2014
2014
Reduction of the 1.55 µm Er3+ emission band half-width in Er doped and Er/Yb co-doped oxy-fluoride glass-ceramics fibers
In earlier papers the authors have shown by XRD measurements and HRTEM imaging/SAED (selected area electron diffraction)/STEM… 
2011
2011
Quantum-interference effects in the o 1 Π u ( v = 1 ) ∼ b 1 Π u ( v = 9 ) Rydberg-valence complex of molecular nitrogen
Quantum-interference effects in the o Πu(v=1)∼b Πu(v=9) Rydberg-valence complex of molecular nitrogen M. O. Vieiteza; T. I… 
2008
2008
Impacts of CFO, IQ imbalance and phase noise on the system performance in OFDM systems
OFDM systems are sensitive to front-end imperfections including CFO, IQ imbalance and phase noise. In practice, these… 
2007
2007
Suppression and recovery of the trapping of atoms using a ladder-type electromagnetically induced transparency
Subnatural linewidth in an optical transition in Cs was obtained by the suppression and recovery of the trapping of atoms. Cold… 
2003
2003
A Model for Step Height, Edge Slope and Linewidth Measurements Using AFM
Nano‐scale linewidth measurements are performed in semiconductor manufacturing and in the data storage industry and will become… 
2002
2002
Ultra-narrow Linewidth FBG Cavity DFB Laser with saturable Absorber
A novel ultra-narrow linewidth single longtudinal mode DFB semiconductor laser in the extended FBG cavity is proposed. The 3… 
2002
2002
Cavity Cooling with a Hot Cavity
Cavity cooling of arbitrary particles by coherent scattering is significantly improved inside resonators with optical gain. The… 
2002
2002
Relative intensity noise measurements of a widely tunable sampled-grating DBR laser
The intensity noise of a sampled-grating distributed Bragg reflector laser with 50-nm tuning range and 45-dB side-mode… 
2000
2000
Electrical critical dimension metrology for 100-nm linewidths and below
In this paper, we have demonstrated an electrical CD process capable of resolving linewidth swell below 100 nm compatible with a… 
1984
1984
Optical Performance And Process Characterizations Of Several High Contrast Metal-Ion-Free Developer Processes
Projection print quality is dependent upon the response of the resist/developer system to the optically projected image. For this… 
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