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Optical techniques for on-line measurement of surface topography
Abstract Optical techniques have great potential for non-destructive and on-line measurements of surface roughness during manufacturing. This paper reviews the state-of-the-art in a number of opticalExpand
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Pilot Study of Automated Bullet Signature Identification Based on Topography Measurements and Correlations *†
Abstract:  A procedure for automated bullet signature identification is described based on topography measurements using confocal microscopy and correlation calculation. Automated search andExpand
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Automatic identification of bullet signatures based on consecutive matching striae (CMS) criteria.
TLDR
The consecutive matching striae (CMS) numeric criteria for firearm and toolmark identifications have been widely accepted by forensic examiners, although there have been questions concerning its observer subjectivity and limited statistical support. Expand
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Comparison of optical and stylus methods for measurement of surface texture
Optical methods are increasingly used for measurement of surface texture, particularly for areal measurements where the optical methods are generally faster. A new Working Group under TechnicalExpand
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Surface finish metrology tutorial
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Direct and inverse problems for light scattered by rough surfaces.
Calculations are performed to relate the stylus profile of a one-dimensionally rough surface to the angular distribution of the light scattered by such a surface. In the direct problem, the angularExpand
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Correlation of topography measurements of NIST SRM 2460 standard bullets by four techniques
Three optical instruments including an interferometric microscope, a Nipkow disc confocal microscope and a laser scanning confocal microscope and a stylus instrument are used for the measurements ofExpand
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Stylus profiling at high resolution and low force.
This paper describes experimental work to improve the lateral resolution of stylus instruments. Our efforts involve (1) use of a fine stylus, (2) low stylus load, (3) high magnification in theExpand
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Development of ballistics identification?from image comparison to topography measurement in surface metrology
TLDR
A Two-dimensional and Three-dimensional Topography Measurement and Correlation System was developed at the National Institute of Standards and Technology for certification of Standard Reference Material 2460/2461 bullets and cartridge cases. Expand
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  • PDF
Topography measurements for determining the decay factors in surface replication
The electro-forming technique is used at National Institute of Standards and Technology (NIST) for the production of standard reference material (SRM) 2461 standard casings to support nationwideExpand
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