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National Institutes of Health

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2019
2019
Modified Mach-Zehnder interferometer for determining the high-order topological charge of Laguerre-Gaussian vortex beams.
This study demonstrates a self-referenced interferometric method to estimate the magnitude and sign of a high-order topological… 
2013
2013
Pengenalan Algoritma Pendekatan Secara Visual dan Interaktif Menggunakan Raptor
Algoritma merupakan mata kuliah dasar di berbagai jurusan yang sangat penting untuk dipahami agar siswa/mahasiswa kelak dapat… 
2012
2012
Impact of Individual Charged Gate-Oxide Defects on the Entire $I_{D}$–$V_{G}$ Characteristic of Nanoscaled FETs
The measurement of the entire ID-VG characteristic of a nanoscaled pMOSFET before and after the capture of a single elementary… 
2012
2012
Enhanced Operation in Charge-Trapping Nonvolatile Memory Device With $\hbox{Si}_{3}\hbox{N}_{4}/\hbox{Al}_{2}\hbox{O}_{3}/\hbox{HfO}_{2}$ Charge-Trapping Layer
A stacked Si<sub>3</sub>N<sub>4</sub>/HfO<sub>2</sub> charge-trapping (CT) layer was proposed to improve erase operation and… 
Highly Cited
2011
Highly Cited
2011
Graphene gate electrode for MOS structure-based electronic devices.
We demonstrate that the use of a monolayer graphene as a gate electrode on top of a high-κ gate dielectric eliminates mechanical… 
2011
2011
Photoinduced intra- and intermolecular electron transfer in solutions and in solid organized molecular assemblies.
The present paper highlights results of a systematic study of photoinduced electron transfer, where the fundamental aspects of… 
2009
2009
Reliability of barrier engineered charge trapping devices for sub-30nm NAND flash
Reliability of charge trapping (CT) devices has been examined in detail, and the path to sub-30nm NAND flash is investigated. All… 
2008
2008
Rapid transport of nano-particles having a fractional elementary charge on average in capacitively-coupled rf discharges by amplitude-modulating discharge voltage.
We have observed transport of nano-particles having, on average, a fractional elementary charge in single pulse and double pulse… 
2006
2006
Detection of Electron Trap Generation due to Constant Voltage Stress on High-κ Gate Stacks
Positive constant voltage stress combined with charge pumping (CP) measurements was applied to study trap generation phenomena in… 
1999
1999
A direct charge pumping technique for spatial profiling of hot-carrier induced interface and oxide traps in MOSFETs
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