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Low Pin Count
Known as:
LPC
, LPC bus
, Low Pin Count bus
The Low Pin Count bus, or LPC bus, is a computer bus used on IBM-compatible personal computers to connect low-bandwidth devices to the CPU, such as…
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45 relations
16-bit
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
Low frequency emphasis for lpc based coding in the frequency domain
シュテファン デーラ
,
ベルンハルト グリル
,
クリスティアン ヘルムリヒ
,
ニコラウス レッテルバッハ
2014
Corpus ID: 67251786
2012
2012
Low pin count DfT technique for RFID ICs
M. G. D. Moraes
,
Marcos Herve
,
M. Lubaszewski
IEEE International Symposium on Defect and Fault…
2012
Corpus ID: 9889173
The need of uniquely identifiable objects for multiple applications has given great attention to RFID ICs over the years. The…
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2012
2012
Safety of Low Pin Count Scan
保罗艾瑞·波黎斯克蒂
2012
Corpus ID: 132524499
Discloses only need two contactless smart card type IC pins are used for standard ATPG test. It may be used for a pin and a clock…
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2010
2010
Using a software exploit to image RAM on an embedded system
Joseph R. Rabaiotti
,
C. Hargreaves
Digital Investigation. The International Journal…
2010
Corpus ID: 14123744
Review
2010
Review
2010
High performance, low pin count packaging
C. E. Bauer
,
R. Fillion
,
H. Neuhaus
Electronic Packaging Technology Conference
2010
Corpus ID: 22744548
Advanced packaging conferences, technical articles, and editorials frequently focus on high pin count devices such as…
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2008
2008
High Test Quality in Low Pin Count Applications
Jayant D'Souza
,
S. Mahadevan
,
+5 authors
Damien Sartoretti
IEEE International Test Conference
2008
Corpus ID: 206680738
We will show the real implementation of a very high test compression scheme for a 3 pin image sensor device. This new approach…
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2007
2007
Debug card and debug method
孔祥云
2007
Corpus ID: 196109642
A debug card is inserted in the slot of a main board. The debug card comprises a programmable logic device, a PCI bus interface…
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2005
2005
Trusted computing and open source
D. Safford
,
Mimi Zohar
Information Security Technical Report
2005
Corpus ID: 205493234
2004
2004
Reaching detente in the design and material selection for Hi Rel WLCSP's
G. Rinne
,
M. Paugh
,
T. Rosson
,
C. Schuckert
Proceedings. 54th Electronic Components and…
2004
Corpus ID: 16295627
As WLCSP packaging technology travels the road to ubiquity a transition is unfolding. WLCSP designs and material selection…
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2002
2002
Reducing Synchronization Overhead in Test Data Compression Environments
P. T. Gonciari
,
B. Al-Hashimi
,
N. Nicolici
2002
Corpus ID: 1472644
Synchronization overhead between the core under test and the automatic test equipment is the main drawback of test data…
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