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In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES… Expand Fault simulation for sequential circuits numbers among the highly compute intensive tasks in the integrated circuit design… Expand Automatic Test Pattern Generation (ATPG) systems are tools for generating tests for digital circuits. Due to the complexity of… Expand HOPE is an efficient parallel fault simulator for synchronous sequential circuits that employs the parallel version of the single… Expand The authors present an efficient sequential circuit parallel fault simulator, HOPE, which simulates 32 faults at a time. HOPE is… Expand The problem of bridging fault simulation under the conventional voltage testing environment is considered. A method to provide… Expand The authors describe PROOFS, a fast fault simulator for synchronous sequential circuits, PROOFS achieves high performance by… Expand This paper describes PROOFS, a super fast fault simulator for synchronous sequential circuits. PROOFS achieves high performance… Expand Delay fault testing is becoming more important as VLSI chips become more complex. Components that are fragments of functions… Expand In order to accelerate an algorithm for test generation, it is necessary to reduce the number of backtracks in the algorithm and… Expand