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Fault (technology)
Known as:
Systematic fault
, Fault
, Random fault
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In document ISO 10303-226, a fault is defined as an abnormal condition or defect at the component, equipment, or sub-system level which may lead to a…
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Related topics
Related topics
23 relations
Boundary-value analysis
Computer fan
Control reconfiguration
Distributed operating system
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Broader (1)
Fault tolerance
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Improving DFA attacks on AES with unknown and random faults
Nan Liao
,
Xiaoxin Cui
,
Kai Liao
,
Tian Wang
,
Dunshan Yu
,
Xiaole Cui
Science China Information Sciences
2016
Corpus ID: 10096719
Differential fault analysis (DFA) aiming at the advanced encryption standard (AES) hardware implementations has become a widely…
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2014
2014
Fault tolerant BeeHive routing in mobile ad-hoc multi-radio network
K. Kiran
,
P. Shenoy
,
K. R. Venugopal
,
L. Patnaik
IEEE REGION 10 SYMPOSIUM
2014
Corpus ID: 22260439
In this paper, fault tolerance in a multi-radio network is discussed. Fault tolerance is achieved using the BeeHive routing…
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2011
2011
Optimization of injection molding process by MPX
M. Stanek
,
D. Maňas
,
M. Maňas
,
O. Šuba
2011
Corpus ID: 55506477
Optimization of injection molding process serves for finding ideal conditions during production of plastic parts and observing…
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2011
2011
Design and Analysis of Networks with Large Components in Presence of Region-Based Faults
Sujogya Banerjee
,
Shahrzad Shirazipourazad
,
Arunabha Sen
IEEE International Conference on Communications…
2011
Corpus ID: 17756921
Connectivity k(G) of a network G is traditionally considered to be the primary metric for evaluation of its fault tolerance…
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2010
2010
Fault tolerant remote terminal units (RTUs) in SCADA systems
S. Misbahuddin
International Symposium on Collaborative…
2010
Corpus ID: 365300
A SCADA system uses a number of remote terminal units (RTUs) for collecting field data and sending it back to a master station…
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2006
2006
Research for Ultrasonic Fast-Identification of the Stick-Weld Defect
Xin Zhao
,
Yansong Zhang
,
Guanlong Chen
IEEE Instrumentation and Measurement Technology…
2006
Corpus ID: 23704655
When stick-weld defect happens, the current inspection methods of weld quality are difficult to achieve an ideal result. This…
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Highly Cited
2003
Highly Cited
2003
A built-in self-repair scheme for semiconductor memories with 2-d redundancy
Jin-Fu Li
,
J. Yeh
,
+4 authors
Eugene Chow
International Test Conference, . Proceedings. ITC…
2003
Corpus ID: 9667
Embedded memories are among the most widely used cores in current system-on-chip (SOC) implementations. Memory cores usually…
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2001
2001
A Boolean satisfiability-based incremental rerouting approach with application to FPGAs
Gi-Joon Nam
,
K. Sakallah
,
Rob A. Rutenbar
Proceedings Design, Automation and Test in Europe…
2001
Corpus ID: 2118172
Incremental redesign is an increasingly essential step in any complex design. Late changes or corrections in functional…
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1995
1995
Fault tolerance in safety critical automotive applications: cost of agreement as a limiting factor
S. Poledna
Twenty-Fifth International Symposium on Fault…
1995
Corpus ID: 15909380
The high availability and safety requirements for automotive electronics are currently almost exclusively addressed by…
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1987
1987
Crystal Structure of a Vermiculite-Anilinium Intercalate
P. Slade
,
C. Dean
,
P. Schultz
,
P. Self
1987
Corpus ID: 55265152
If anilinium ions are intercalated into Llano vermiculite, the stacking order of adjacent silicate layers is increased, resulting…
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