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Dither

Known as: Didder, Even toned screening, Dither (disambiguation) 
Dither is an intentionally applied form of noise used to randomize quantization error, preventing large-scale patterns such as color banding in… 
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Related topics

Related topics

50 relations
Anti-aliasingAtomic-force microscopyBinary imageBrillouin scattering

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2014
2014
A neural dynamic model of associative two-process theory: The differential outcomes effect and infant development
In animal and human learning, outcome expectancy is understood to control action under a number of learning paradigms. One such… 
Review
2012
Review
2012
Overview of Audio Watermarking Techniques
— With the increasing usage of digital multimedia, the protection of intellectual property rights problem has become a very… 
2012
2012
A Dither-Less All Digital PLL for Cellular Transmitters
An all-digital frequency synthesizer for cellular transmitter is presented. Low phase-noise is achieved both in-band and out-of… 
2008
2008
A 10.3 Gb/s Burst-Mode CDR Using a ΔΣ DAC
A burst-mode clock and data recovery circuit (CDR) for 10 G-EPON systems is described. We propose a new architecture with a… 
2008
2008
Making the Water Move: Techno-Historic Limits in the Game Aesthetics of Myst and Doom
This paper proposes that the technical limitations at the time of a game’s creation have an enormous impact on the overall… 
2008
2008
Integration of a cellular handset power amplifier and a DC/DC converter in a Silicon-On-Insulator (SOI) technology
A DC/DC buck converter was integrated with a cellular handset power amplifier (PA) in a silicon-on-insulator (SOI) technology… 
2004
2004
Theory and applications of incremental /spl Delta//spl Sigma/ converters
Analog-Digital (A/D) converters used in instrumentation and measurements often require high absolute accuracy, including very… 
2003
2003
Photoionization of individual CdSe/CdS core/shell nanocrystals on silicon with 2-nm oxide depends on surface band bending
CdSe/CdS nanocrystals are studied by electrostatic force microscopy (EFM) on n- and p-type silicon with 2-nm surface oxide and… 
Highly Cited
2001
Highly Cited
2001
Color and Number Counts
We present near-IR (J and Ks) number counts and colors of galaxies detected in deep VLT-ISAAC images centered on the Chandra Deep… 
2001
2001
Dynamic range and acquisition system
The limitation of the dynamic range given by noise and spurious signals is discussed. Attention is paid to the proper unit (dBFS… 
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