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Atomic-force microscopy
Known as:
AFM in Bio
, Atomic force probe
, AFM
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Atomic-force microscopy (AFM) or scanning-force Microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated…
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Related topics
Related topics
12 relations
Density functional theory
Differential amplifier
Dither
Hysteresis
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2006
2006
Dynamic-force spectroscopy measurement with precise force control using atomic-force microscopy probe
O. Takeuchi
,
T. Miyakoshi
,
+6 authors
H. Shigekawa
2006
Corpus ID: 56081390
The accuracy of dynamic-force spectroscopy (DFS), a promising technique of analyzing the energy landscape of noncovalent…
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2006
2006
Thermal calibration of photodiode sensitivity for atomic force microscopy
P. Attard
,
Torbjörn Pettersson
,
M. Rutland
2006
Corpus ID: 30455195
The photodiode sensitivity in the atomic force microscope is calibrated by relating the voltage noise to the thermal fluctuations…
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2005
2005
An investigation of pulp fibre surfaces by atomic force microscopy
N. Chhabra
,
J. K. Spelt
,
C.-M. Yip
,
M. Kortschot
2005
Corpus ID: 193463785
Lorsque des fibres ligneuses se lient pour former une feuille de papier, le contact s'etablit d'abord entre leurs surfaces…
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2003
2003
Atomic Force Microscopy Study of Clay Nanoplatelets and Their Impurities
R. Piner
,
T. Xu
,
F. Fisher
,
Y. Qiao
,
R. Ruoff
2003
Corpus ID: 39851078
The results of an in-depth study of 1 nm thick individual clay sheets by atomic force microscopy (AFM) are presented. Several…
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Highly Cited
2002
Highly Cited
2002
Microcrystalline silicon thin films studied by atomic force microscopy with electrical current detection
B. Rezek
,
J. Stuchlík
,
A. Fejfar
,
J. Kǒcka
2002
Corpus ID: 54899901
Hydrogenated microcrystalline silicon (μc-Si:H) layers with thickness from 100 to 540 nm were prepared in situ by plasma enhanced…
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2001
2001
Models for quantitative charge imaging by atomic force microscopy
E. Boer
,
L. Bell
,
M. Brongersma
,
H. Atwater
2001
Corpus ID: 40791347
Two models are presented for quantitative charge imaging with an atomic-force microscope. The first is appropriate for noncontact…
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Highly Cited
1999
Highly Cited
1999
PATTERNED POLYMER MULTILAYERS AS ETCH RESISTS
W. Huck
,
Lin Yan
,
A. Stroock
,
R. Haag
,
G. Whitesides
1999
Corpus ID: 11442393
This paper describes the synthesis and characterization of patterned polymer multilayers on self-assembled monolayers (SAMs) and…
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Highly Cited
1998
Highly Cited
1998
Scanning force microscopy characterization of individual carbon nanotubes on electrode arrays
J. Muster
,
M. Burghard
,
S. Roth
,
G. Duesberg
,
E. Hernández
,
Á. Rubio
1998
Corpus ID: 56512528
We report the controlled adsorption of individual multi- and single-walled carbon nanotubes from purified aqueous dispersions…
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Highly Cited
1995
Highly Cited
1995
Microtribological Characterization of Self Assembled and Langmuir-Blodgett Monolayers by Atomic and Friction Force Microscopy,
B. Bhushan
,
Ashok V. Kulkarni
,
+4 authors
M. Belin
1995
Corpus ID: 19695406
Abstract : Organized and dense monolayers were produced by chemical grafting of molecules and by Langmuir Blodgett (L-B…
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Highly Cited
1995
Highly Cited
1995
Si nanostructures fabricated by anodic oxidation with an atomic force microscope and etching with an electron cyclotron resonance source
E. Snow
,
W. Juan
,
S. Pang
,
P. Campbell
1995
Corpus ID: 55858861
Nanometer‐scale Si structures have been fabricated by anodic oxidation with an atomic force microscope (AFM) and dry etching…
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