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Atomic-force microscopy

Known as: AFM in Bio, Atomic force probe, AFM 
Atomic-force microscopy (AFM) or scanning-force Microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated… 
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Related topics

Related topics

12 relations
Density functional theoryDifferential amplifierDitherHysteresis

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2010
2010
Bionanomanipulation Using Atomic Force Microscopy
This paper explains how an AFM-based nanorobot was developed to visualize and quantify the dynamics of cell proteins interactions… 
Highly Cited
2009
Highly Cited
2009
Dynamics of repulsive dual-frequency atomic force microscopy
In bimodal atomic force microscopy, two flexural modes are driven at their resonances. The oscillation of the second eigenmode… 
Highly Cited
2006
Highly Cited
2006
Adaptable End Effector for Atomic Force Microscopy Based Nanomanipulation
Nanomanipulation using the atomic force microscope (AFM) has been extensively investigated for many years. But the efficiency and… 
Highly Cited
2004
Highly Cited
2004
Spirobifluorene-linked bisanthracene: An efficient blue emitter with pronounced thermal stability
Spiro-FPA, a novel blue emitter, in which two identical anthracene luminophores are linked orthogonally around a spirobifluorene… 
2003
2003
Atomic Force Microscopy Study of Clay Nanoplatelets and Their Impurities
The results of an in-depth study of 1 nm thick individual clay sheets by atomic force microscopy (AFM) are presented. Several… 
2003
2003
An observer based sample detection scheme for atomic force microscopy
In dynamic mode operation of atomic force microscopes steady state signals like amplitude and phase are typically used for the… 
Highly Cited
2001
Highly Cited
2001
Parallel atomic force microscopy with optical interferometric detection
We have developed an atomic force microscope that uses interferometry for parallel readout of a cantilever array. Each cantilever… 
2000
2000
Accurate dimensional metrology with atomic force microscopy
Atomic force microscopes (AFMs) generate three dimensional images with nanometer level resolution and, consequently, are used in… 
Highly Cited
1998
Highly Cited
1998
Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)
Total-energy pseudopotential calculations are used to study the imaging process in noncontact atomic-force microscopy on Si ~111… 
Highly Cited
1995
Highly Cited
1995
Open‐core screw dislocations in GaN epilayers observed by scanning force microscopy and high‐resolution transmission electron microscopy
Structural investigations of organometallic vapor phase epitaxy grown α‐GaN films using high‐resolution transmission electron… 
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