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Dell monitors

Known as: Dell Ultrasharp 2405fpw, Dell UltraSharp 3007WFP, Ultrasharp 
Dell has used a number of video connector designs for their monitors over the years: * Analog video: * Composite * S-Video * Component * VGA… 
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Related topics

Related topics

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Component videoComposite videoDesktop computerDigital Visual Interface

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
Ultrasharp magnetization steps in the antiferromagnetic itinerant-electron systemLaFe12B6
The remarkable intrinsic magnetic properties of the LaFe12B6 compound have been studied by neutron powder diffraction (NPD) and… 
2016
2016
Ultrasharp Fano Resonances Based on the Circular Cavity Optimized by a Metallic Nanodisk
A compact structure is proposed to achieve double ultrasharp Fano profiles, which comprises with a metal-insulator-metal (MIM… 
2010
2010
Ultrasharp carbon whisker optical fiber probes for scanning near-field optical microscopy
We report the growth of ultrasharp carbon whiskers onto apertured near-field optical glass fiber probes. The ultrasharp carbon… 
2009
2009
Influence of Electrode Characteristics on DC Point-to-Plane Breakdown in High-Pressure Gaseous and Supercritical Carbon Dioxide
Discharges in supercritical conditions is a new field in plasma science. The supercritical phase has distinctive properties that… 
Highly Cited
2008
Highly Cited
2008
Atomically sharp catalyst-free wurtzite GaAs /AlGaAs nanoneedles grown on silicon
We report a catalyst-free, self-assembled growth mode generating single-crystal wurtzite phase ultrasharp GaAs∕AlGaAs nanoneedles… 
2005
2005
Fluorescence nanoscopy: Breaking the diffraction barrier by the RESOLFT concept
  • S. Hell
  • IEEE LEOS Annual Meeting Conference Proceedings
  • 2005
  • Corpus ID: 39120376
A general concept is described for breaking the diffraction barrier in far-field microscopy through reversible saturable optical… 
2004
2004
Ultrasharp high-aspect-ratio probe array for SECM and AFM Analysis
A powerful experimental tool, ultra-sharp nano-electrode array is designed, fabricated and characterized. The application on a… 
Highly Cited
2003
Highly Cited
2003
Direct measurement of nanoscale sidewall roughness of optical waveguides using an atomic force microscope
An atomic force microscope (AFM) with an ultrasharp tip was used to directly measure the sidewall profile of InP/InGaAsP… 
1999
1999
Field emission from atomic size sources
The source area of electron field emission from ultrasharp (ill)-oriented tungsten tips terminated by a few (down to one single… 
1998
1998
Two-dimensional dopant profiling of a 60 nm gate length nMOSFET using scanning capacitance microscopy
It is now possible using scanning capacitance microscopy to directly obtain a two-dimensional profile of the doping in MOSFETs… 
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