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Defective pixel
Known as:
Stuck pixel
, Defective pixels
, Pixel fault
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Defective pixels are pixels on a liquid crystal display (LCD) that are not performing as expected. The ISO standard ISO 13406-2 distinguishes between…
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Related topics
Related topics
13 relations
CMOS
Charge-coupled device
Dark-frame subtraction
ISO 13406-2
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Broader (1)
Digital imaging
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
THE ARCONS PIPELINE: DATA REDUCTION FOR MKID ARRAYS
J. V. Eyken
,
J. V. Eyken
,
+10 authors
B. Mazin
2015
Corpus ID: 5756050
The Array Camera for Optical to Near-IR Spectrophotometry, or ARCONS, is a camera based on Microwave Kinetic Inductance Detectors…
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2015
2015
Single Event Upsets and Hot Pixels in digital imagers
G. Chapman
,
Rahul Thomas
,
+4 authors
Z. Koren
IEEE International Symposium on Defect and Fault…
2015
Corpus ID: 206608216
From extensive study of digital imager defects, we found that permanent “Hot Pixels” are the main long term digital camera…
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2013
2013
Error resilient MRF message passing architecture for stereo matching
Jungwook Choi
,
Eric P. Kim
,
Rob A. Rutenbar
,
Naresh R Shanbhag
SiPS Proceedings
2013
Corpus ID: 24149377
Message passing based inference algorithms have immense importance in real-world applications. In this paper, error resilience of…
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2010
2010
Processing of the image from infrared focal plane array using FPGA-based system
T. Sosnowski
,
G. Bieszczad
,
M. Kastek
,
H. Madura
International Conference on Mixed Design of…
2010
Corpus ID: 6468854
The paper presents the image processing and analysis system for a thermal camera. Presented device controls the microbolometer…
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2010
2010
Extraction of parasitic capacitance for toroidal ferrite core inductor
Shishan Wang
,
Liu Zeyuan
,
Y. Xing
IEEE Conference on Industrial Electronics and…
2010
Corpus ID: 17166928
In the higher frequency range, an inductor can be considered an equivalent circuit model, which is formed of a series branch of a…
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2009
2009
Multispectral EO/IR sensor model for evaluating UV, visible, SWIR, MWIR and LWIR system performance
A. Sood
,
Robert A. Richwine
,
Y. Puri
,
N. Dhar
,
D. Polla
,
P. Wijewarnasuriya
Defense + Commercial Sensing
2009
Corpus ID: 122031973
Next Generation EO/IR Sensors using Nanostructures are being developed for a variety of Defense Applications. In addition, large…
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2004
2004
A Novel Polymorphic mtDNA Marker for Population Studies of the Pink Shrimp, Farfantepenaeus duorarum (Crustacea, Penaeidae)
Michaø Grabowski
,
W. Grater
,
K. C. Stuck
2004
Corpus ID: 83929084
The pink shrimp, Farfantepenaeus duorarum, is one of the most important shrimp species commercially harvested along the Gulf and…
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2004
2004
GROUND MOVEMENTS CAUSED BY CAISSON INSTALLATION AT THE LURIE EXCAVATION PROJECT
J. Hoffman
,
Jill Roboski
,
R. Finno
2004
Corpus ID: 16689010
Lateral deformation caused by the installation of 0.76 m to 1.5 m diameter, caissons were measured by inclinometers placed at the…
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1999
1999
ECMCS ' 99 EURASIP Conference DSP for Multimedia Communications and Services Kraków , 24-26 June VECTOR SD-ROM FILTER FOR REMOVAL OF IMPULSE NOISE FROM COLOR IMAGES
M. Moore
,
M. Gabbouj
,
S. Mitra
1999
Corpus ID: 16322841
One well-studied image processing task is the removal of impulse noise from images. Impulse noise can be introduced during image…
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1980
1980
Test generation for delay faults using stuck-at-fault test set
Chi-Chang Liaw
,
Yin-He Su
,
Y. Malaiya
1980
Corpus ID: 17847794
Delay faults are referred to the out-ofspecification path delays which result in unstabilized or incorrect circuit behaviors. The…
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