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Counter (digital)
Known as:
Digital counter
, Counters (digital)
, Counter (electronic)
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In digital logic and computing, a counter is a device which stores (and sometimes displays) the number of times a particular event or process has…
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Related topics
Related topics
50 relations
4000 series
555 timer IC
Aliasing (computing)
Amazon ElastiCache
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2017
Highly Cited
2017
Twenty five years of social and environmental accounting research within Critical Perspectives of Accounting: Hits, misses and ways forward
C. Deegan
2017
Corpus ID: 147994861
2011
2011
Synchronous sequential computation with molecular reactions
Hua Jiang
,
Marc D. Riedel
,
K. Parhi
Design Automation Conference
2011
Corpus ID: 7167635
Just as electronic systems implement computation in terms of voltage (energy per unit charge), molecular systems compute in terms…
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Highly Cited
2009
Highly Cited
2009
Thread criticality predictors for dynamic performance, power, and resource management in chip multiprocessors
A. Bhattacharjee
,
M. Martonosi
International Symposium on Computer Architecture
2009
Corpus ID: 1076692
With the shift towards chip multiprocessors (CMPs), exploiting and managing parallelism has become a central problem in computing…
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Highly Cited
2003
Highly Cited
2003
Algorithms for the variable sized bin packing problem
Jangha Kang
,
Sungsoo Park
European Journal of Operational Research
2003
Corpus ID: 156952
Highly Cited
2002
Highly Cited
2002
Burst tries: a fast, efficient data structure for string keys
S. Heinz
,
J. Zobel
,
H. Williams
TOIS
2002
Corpus ID: 14122377
Many applications depend on efficient management of large sets of distinct strings in memory. For example, during index…
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Highly Cited
1998
Highly Cited
1998
Benchmark for radar allocation and tracking in ECM
W. Blair
,
G. Watson
,
T. Kirubarajan
,
Y. Bar-Shalom
1998
Corpus ID: 56814999
A benchmark problem for tracking maneuvering targets is presented. The benchmark problem involves beam pointing control of a…
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Highly Cited
1995
Highly Cited
1995
High-level test generation using physically-induced faults
M. Hansen
,
J. Hayes
Proceedings of the ... IEEE VLSI Test Symposium
1995
Corpus ID: 13059990
A high-level fault modeling and testing philosophy is proposed which is aimed at ensuring full detection of low level, physical…
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1989
1989
Techniques and New Developments in Photosynthesis Research
M. Grunberg‐Manago
,
B. Clark
NATO ASI Series
1989
Corpus ID: 27185713
Proceedings held July-August 1988. Seventy-five contributions represent current thoughts and activities in the field across a…
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Review
1985
Review
1985
A survey of radar ECM and ECCM
Neng-Jing Li
,
Yi-Ting Zhang
1985
Corpus ID: 108648307
Radar electronic countermeasure (ECM) and electronic counter-countermeasures (ECCM) form the principal conflicting pair in modern…
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Highly Cited
1950
Highly Cited
1950
Ionization chambers and counters
D. Wilkinson
1950
Corpus ID: 92939884
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