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Burst noise

Known as: Popcorn noise, Burst, Random telegraph noise 
Burst noise is a type of electronic noise that occurs in semiconductors. It is also called popcorn noise, impulse noise, bi-stable noise, or random… 
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Related topics

Related topics

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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
CAFM based spectroscopy of stress-induced defects in HfO2 with experimental evidence of the clustering model and metastable vacancy defect state
In this study, we perform random telegraph noise (RTN) spectroscopy on ultra-thin HfÜ2 dielectric films using a conductive… 
2014
2014
A physics-based RTN variability model for MOSFETs
Low Frequency Noise (LFN) and Random Telegraph Noise (RTN) are performance limiters in many analog and digital circuits. For… 
Highly Cited
2010
Highly Cited
2010
Direct observation of RTN-induced SRAM failure by accelerated testing and its application to product reliability assessment
A new accelerated testing scheme for detecting SRAM bit failure caused by random telegraph noise (RTN) is proposed. By repeatedly… 
2010
2010
Transport through quantum-dot spin valves containing magnetic impurities
We investigate transport through a single-level quantum dot coupled to noncollinearly magnetized ferromagnets in the presence of… 
2008
2008
RTS Noise Characterization in Flash Cells
A method is presented for using noise spectroscopy to efficiently characterize random telegraph signal (RTS) in flash cells, in… 
Highly Cited
2006
Highly Cited
2006
The Impact of Random Telegraph Signals on the Scaling of Multilevel Flash Memories
This paper describes for the first time the observation of the threshold voltage (Vth) fluctuation due to random telegraph signal… 
Highly Cited
1998
Highly Cited
1998
Noise properties of ferromagnetic tunnel junctions
We report measurements of voltage fluctuations in magnetic tunnel junctions which exhibit both high and low magnetoresistance (MR… 
1997
1997
The gate bias and geometry dependence of random telegraph signal amplitudes [MOSFET]
A new random telegraph signal (RTS) amplitude model based upon band bending fluctuations has been developed, in contrast to other… 
Highly Cited
1996
Highly Cited
1996
Low-frequency noise in UHV/CVD epitaxial Si and SiGe bipolar transistors
In this work a comprehensive investigation of low-frequency noise in ultrahigh vacuum/chemical vapor deposition (UHV/CVD) Si and… 
1996
1996
Random Telegraph Signal in the Quasi-Breakdown Current of MOS Capacitors
Observations of multilevel fluctuations (random telegraph signal, RTS) in the quasi breakdown (QB) current in thin (below 5nm… 
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