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Burst noise

Known as: Popcorn noise, Burst, Random telegraph noise 
Burst noise is a type of electronic noise that occurs in semiconductors. It is also called popcorn noise, impulse noise, bi-stable noise, or random… 
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Related topics

Related topics

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Asymmetric digital subscriber lineAtomic electron transitionIon implantationList of noise topics

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
CAFM based spectroscopy of stress-induced defects in HfO2 with experimental evidence of the clustering model and metastable vacancy defect state
In this study, we perform random telegraph noise (RTN) spectroscopy on ultra-thin HfÜ2 dielectric films using a conductive… 
2013
2013
Capture Cross Section of Traps Causing Random Telegraph Noise in Gate-Induced Drain Leakage Current
In this brief, we investigated random telegraph noise (RTN) in the gate-induced drain leakage (GIDL) current of a MOSFET. Using… 
2011
2011
Tunnel Oxide Nitridation Effect on the Evolution of $V_{t}$ Instabilities (RTS/QED) and Defect Characterization for Sub-40-nm Flash Memory
We report the impact of tunnel oxide nitridation (TON) on the evolution of random telegraph signal (RTS) and quick electron… 
Highly Cited
2010
Highly Cited
2010
Direct observation of RTN-induced SRAM failure by accelerated testing and its application to product reliability assessment
A new accelerated testing scheme for detecting SRAM bit failure caused by random telegraph noise (RTN) is proposed. By repeatedly… 
2010
2010
Transport through quantum-dot spin valves containing magnetic impurities
We investigate transport through a single-level quantum dot coupled to noncollinearly magnetized ferromagnets in the presence of… 
2009
2009
Experimental investigation and design optimization guidelines of characteristic variability in silicon nanowire CMOS technology
In this paper, the characteristic variability in gate-all-around (GAA) silicon nanowire MOSFETs (SNWTs) is experimentally studied… 
2009
2009
Statistical RTS model for digital circuits
2007
2007
N-MOSFET oxide trap characterization induced by nitridation process using RTS noise analysis
1999
1999
The feasibility study of transporting IS-95 CDMA signals over HFC networks
This letter studies the feasibility of transmitting IS-95 code-division multiple-access (CDMA) wireless signals in hybrid-fiber… 
Highly Cited
1998
Highly Cited
1998
Noise properties of ferromagnetic tunnel junctions
We report measurements of voltage fluctuations in magnetic tunnel junctions which exhibit both high and low magnetoresistance (MR… 
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