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Btrieve

Known as: Btrieve Technologies, Inc., BTI, SoftCraft 
Btrieve is a transactional database (navigational database) software product. It is based on Indexed Sequential Access Method (ISAM), which is a way… 
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Related topics

Related topics

33 relations
Application programming interfaceArchitecture of BtrieveConcurrency (computer science)DOS

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2018
Highly Cited
2018
Comphy - A compact-physics framework for unified modeling of BTI
Highly Cited
2013
Highly Cited
2013
Intrinsic transistor reliability improvements from 22nm tri-gate technology
This paper highlights the intrinsic reliability capabilities of Intel's 22nm process technology, which introduced the tri-gate… 
Highly Cited
2011
Highly Cited
2011
From mean values to distributions of BTI lifetime of deeply scaled FETs through atomistic understanding of the degradation
Based on detailed understanding of behavior and statistics of individual defects, we have presented a new methodology to predict… 
Review
2011
Review
2011
Wind turbine noise mechanisms and some concepts for its control
INTRODUCTION Climate change policies have forced governments around the world to mandate large increases in wind power… 
Highly Cited
2011
Highly Cited
2011
Statistical Model for MOSFET Bias Temperature Instability Component Due to Charge Trapping
Bias temperature instability (BTI) is a serious reliability concern for MOS transistors. This paper covers theoretical analysis… 
Highly Cited
2009
Highly Cited
2009
An All-In-One Silicon Odometer for Separately Monitoring HCI, BTI, and TDDB
We present an on-chip reliability monitor capable of separating the aging effects of hot carrier injection (HCI), bias… 
Review
2009
Review
2009
Unpacking the Rule of Law: A Review of Judicial Independence Measures
The rule of law has become a favored solution to crucial substantive problems in the social sciences. Measures of the concept… 
Highly Cited
2004
Highly Cited
2004
Investigation and modeling of interface and bulk trap generation during negative bias temperature instability of p-MOSFETs
Negative bias temperature instability is studied in thick and thin gate oxide p-MOSFETs. The relative contributions of interface… 
Highly Cited
2004
Highly Cited
2004
Physical model of BTI, TDDB and SILC in HfO/sub 2/-based high-k gate dielectrics
The microscopic mechanism of the degradation occurring in HfO/sub 2/-based high-k/IL dual layer gate insulator has been… 
Highly Cited
1999
Highly Cited
1999
The impact of bias temperature instability for direct-tunneling ultra-thin gate oxide on MOSFET scaling
This paper presents a new reliability scaling scenario for CMOS devices with direct-tunneling ultra-thin gate oxide. Device… 
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