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Apple Multiple Scan 14 Display

The Apple Multiple Scan 14 Display is a 12.4" viewable shadow mask CRT that was manufactured by Apple Inc. from August 7, 1995 until September 14… Expand
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2008
2008
Various compression methods have been proposed for tackling the problem of increasing test-data volume of contemporary, core… Expand
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2007
2007
The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test… Expand
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2005
2005
We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of… Expand
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2004
2004
In this paper, we propose a method of test compression for multiple scan designs. Instead of the conventional serial scan chains… Expand
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Highly Cited
2003
Highly Cited
2003
We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can… Expand
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Highly Cited
2003
Highly Cited
2003
We propose a new method for reducing test data volume and test application time in scan designs with multiple scan chains. The… Expand
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Highly Cited
1998
Highly Cited
1998
Single scan chain architectures suffer from long test application time, while multiple scan chain architectures require large pin… Expand
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Highly Cited
1998
Highly Cited
1998
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a… Expand
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Highly Cited
1998
Highly Cited
1998
The paper presents an efficient scheme to compress and decompress in parallel deterministic test patterns for circuits with… Expand
1996
1996
This paper presents a new effective scheme to decompress in parallel deterministic test patterns for circuits with multiple scan… Expand
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