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Apple Multiple Scan 14 Display

The Apple Multiple Scan 14 Display is a 12.4" viewable shadow mask CRT that was manufactured by Apple Inc. from August 7, 1995 until September 14… 
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Related topics

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3 relations
Cathode ray tubeList of products discontinued by Apple Inc.Shadow mask

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2007
2007
A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design
The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test… 
2006
2006
Scan-BIST based on transition probabilities for circuits with single and multiple scan chains
It is demonstrated that it is possible to generate a deterministic test set that detects all the detectable single stuck-at… 
2005
2005
A novel method of improving transition delay fault coverage using multiple scan enable signals
We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of… 
2005
2005
Low Power Test Compression Technique for Designs with Multiple Scan Chain
This paper presents a new DFT technique that can significantly reduce test data volume as well as scan-in power consumption for… 
2004
2004
Integrating multiple scan matching results for ego-motion estimation with uncertainty
This paper describes an ego-motion estimation method by integrating multiple scan matching results. The method considers both the… 
2004
2004
The efficient multiple scan chain architecture reducing power dissipation and test time
The efficient use of unspecified bit in input test cube and its response test cube (henceforth, test set) reduces power… 
2003
2003
Designing multiple scan chains for systems-on-chip
We propose a branch-and-bound framework for designing non-reconfigurable multiple scan chains for systems-on-chip to minimize… 
Highly Cited
2000
Highly Cited
2000
Peak-power reduction for multiple-scan circuits during test application
This paper proposes a novel method to reduce the peak power of multiple scan chain based circuits during testing. The peak… 
Highly Cited
1998
Highly Cited
1998
Using a single input to support multiple scan chains
Single scan chain architectures suffer from long test application time, while multiple scan chain architectures require large pin… 
Highly Cited
1993
Highly Cited
1993
Optimal Configuring of Multiple Scan Chains
To reduce the high test time for serial scan designs, the use of multiple scan chains has been proposed. In this paper, the… 
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