Apple Multiple Scan 14 Display

The Apple Multiple Scan 14 Display is a 12.4" viewable shadow mask CRT that was manufactured by Apple Inc. from August 7, 1995 until September 14… (More)
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2010
2010
This paper presents a smoothing technique for the output sequence of linear feedback shift registers (LFSR) to reduce power… (More)
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2008
2008
Various compression methods have been proposed for tackling the problem of increasing test-data volume of contemporary, core… (More)
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2007
2007
The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test… (More)
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2005
2005
This paper presents a new DFT technique that can significantly reduce test data volume as well as scan-in power consumption for… (More)
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2004
2004
The efficient use of unspecified bit in input test cube and its response test cube (henceforth, test set) reduces power… (More)
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2004
2004
In this paper, we propose a method of test compression for multiple scan designs. Instead of the conventional serial scan chains… (More)
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Highly Cited
2003
Highly Cited
2003
We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can… (More)
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Highly Cited
2003
Highly Cited
2003
∗ Research of H. Tang and S. M. Reddy supported in part by NSF Grant No. CCR-0097005 and by SRC Grant No. 2001-TJ-949. Research… (More)
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2003
2003
Multiple scan chain has been used in DFT (design for test) architectures primarily to reduce test application time. Since power… (More)
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1996
1996
This paper presents a new effective scheme to decompress in parallel deterministic test patterns for circuits with multiple scan… (More)
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