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Apple Multiple Scan 14 Display

The Apple Multiple Scan 14 Display is a 12.4" viewable shadow mask CRT that was manufactured by Apple Inc. from August 7, 1995 until September 14… 
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Related topics

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3 relations
Cathode ray tubeList of products discontinued by Apple Inc.Shadow mask

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2008
2008
Multilevel-Huffman Test-Data Compression for IP Cores With Multiple Scan Chains
Various compression methods have been proposed for tackling the problem of increasing test-data volume of contemporary, core… 
2007
2007
A Multilayer Data Copy Test Data Compression Scheme for Reducing Shifting-in Power for Multiple Scan Design
The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test… 
2005
2005
A novel method of improving transition delay fault coverage using multiple scan enable signals
We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of… 
2004
2004
Multiple scan tree design with test vector modification
In this paper, we propose a method of test compression for multiple scan designs. Instead of the conventional serial scan chains… 
Highly Cited
2003
Highly Cited
2003
On reducing test data volume and test application time for multiple scan chain designs
We propose a new method for reducing test data volume and test application time in scan designs with multiple scan chains. The… 
Highly Cited
2000
Highly Cited
2000
Peak-power reduction for multiple-scan circuits during test application
This paper proposes a novel method to reduce the peak power of multiple scan chain based circuits during testing. The peak… 
Highly Cited
1998
Highly Cited
1998
Using a single input to support multiple scan chains
Single scan chain architectures suffer from long test application time, while multiple scan chain architectures require large pin… 
Highly Cited
1998
Highly Cited
1998
Deterministic BIST with Multiple Scan Chains
A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a… 
Highly Cited
1998
Highly Cited
1998
Test Data Decompression for Multiple Scan Designs with Boundary Scan
The paper presents an efficient scheme to compress and decompress in parallel deterministic test patterns for circuits with… 
Highly Cited
1993
Highly Cited
1993
Optimal Configuring of Multiple Scan Chains
To reduce the high test time for serial scan designs, the use of multiple scan chains has been proposed. In this paper, the… 
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