Apple Multiple Scan 14 Display
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Various compression methods have been proposed for tackling the problem of increasing test-data volume of contemporary, core… Expand The random-like filling strategy pursuing high compression for today's popular test compression schemes introduces large test… Expand We propose a novel delay test method for achieving higher delay fault coverage. Multiple scan enable signals are used none of… Expand In this paper, we propose a method of test compression for multiple scan designs. Instead of the conventional serial scan chains… Expand We consider issues related to the reduction of scan test data in designs with multiple scan chains. We propose a metric that can… Expand We propose a new method for reducing test data volume and test application time in scan designs with multiple scan chains. The… Expand Single scan chain architectures suffer from long test application time, while multiple scan chain architectures require large pin… Expand A deterministic BIST scheme for circuits with multiple scan paths is presented. A procedure is described for synthesizing a… Expand The paper presents an efficient scheme to compress and decompress in parallel deterministic test patterns for circuits with… Expand This paper presents a new effective scheme to decompress in parallel deterministic test patterns for circuits with multiple scan… Expand