Multi-degree smoother for low power consumption in single and multiple scan-chains BIST

Abstract

This paper presents a smoothing technique for the output sequence of linear feedback shift registers (LFSR) to reduce power consumption in test-per-scan built-in self-test (BIST) applications. The proposed smoother is implemented by adding one multiplexer between the LFSR and scan-chain input of a single scan-chain. The size of the multiplexer is determined… (More)
DOI: 10.1109/ISQED.2010.5450502

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