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coenzyme Q10 600 MG Oral Wafer [Chew Q]
Known as:
Chew Q ubidecarenone 600 MG Oral Wafer
, Chew Q 600 MG Oral Wafer
, CoQ-10 600 MG Oral Wafer [Chew Q]
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National Institutes of Health
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Oral Wafer
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2014
2014
Daya Cerna Wafer Komplit Limbah Sayuran Pasar Terhadap Domba Ekor Tipis (Ovis aries)
Yogi Ajeng Ningrum
2014
Corpus ID: 137332129
2009
2009
A Wavelet-Based Approach in Detecting Visual Defects on Wafer Dies
Yeh Chihao
,
Wu Fulchiang
,
Chang Chinglan
,
Chiu Chuiyu
,
Ji Weilung
2009
Corpus ID: 106682847
The objective of this paper is to implement two-dimensional wavelet transform (2-D WT) in detecting the visualdefects such as…
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2008
2008
Sapphire grinding device of wafer backside
선충석
2008
Corpus ID: 139832642
A sapphire grinding device of a wafer backside is provided to enhance productivity by performing continuously a first polishing…
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2007
2007
Bi-Directional Reflectivity of Surfaces with Anisotropic Roughness on the Wafer Backside
Pei-feng HsuandRobert
,
Mechanical andAerospace
International Conference on Advanced Thermal…
2007
Corpus ID: 16985304
Light scattering from rough surfaces is an area of research that has received a great deal of interest from several engineering…
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2004
2004
New LDMOS Model Delivers Powerful Transistor Library— Part 2: Library Applications
R. Pengelly
,
Cree Microwave
,
L. Dunleavy
,
W. Clausen
,
T. Weller
,
L. Emmadi
2004
Corpus ID: 8515148
Last month, Part 1 of this article introduced the new CMC (Curtice/Modelithics/Cree) non-linear LDMOS FET transistor model. The…
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1996
1996
Wafer-Stepper mit einer Schnittstelle
Chung-Jae Yongin Lee
,
Soon Jong Park
,
Y. Park
,
Jong-Sun Yongin Yun
1996
Corpus ID: 132419994
Wafer-Stepper mit einer Schnittstelle (200), einer Kammereinheit (100) und einer Haupteinheit (300), die eine Steuerlogik zum…
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1995
1995
Epitaxie-Wafer für eine lichtemittierende Diode
Shigetaka Murasato
,
Koichi Hasegawa
1995
Corpus ID: 141435575
1987
1987
Prüfeinrichtung zur Wafer-Prüfung
G. Krüger
1987
Corpus ID: 104738165
Prufeinrichtung zum Prufen von Chips aufweisende Wafers (35) auf elektrische Fehlerfreiheit der Chips. Sie weist eine an einem…
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