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coenzyme Q10 600 MG Oral Wafer [Chew Q]
Known as:
Chew Q ubidecarenone 600 MG Oral Wafer
, Chew Q 600 MG Oral Wafer
, CoQ-10 600 MG Oral Wafer [Chew Q]
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National Institutes of Health
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Oral Wafer
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2017
2017
Physical analysis approach to investigate wafer backside discoloration
Siow Fei Tin
,
Lee Wei Cheat
International Symposium on the Physical and…
2017
Corpus ID: 32354006
This paper illustrates physical analysis approach to understand the nature of wafer backside metallization (BSM) discoloration…
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2012
2012
Transistor architecture impact on wafer inspection
T. Crimmins
Advanced Lithography
2012
Corpus ID: 109071325
Pitch and CD scaling have been the main drivers of wafer inspection (WI) requirements, with tighter pitches and smaller CD's…
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2009
2009
Productivity improvement in the wafer backside cleaning before exposure
S. Nishikido
,
T. Kitano
,
Y. Tokunaga
,
M. Strobl
,
Yu Chen Lin
Advanced Lithography
2009
Corpus ID: 119765064
In the photolithography process, with the miniaturization of pattern size, depth of focus (D.O.F) is also becoming smaller and…
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2007
2007
Bi-Directional Reflectivity of Surfaces with Anisotropic Roughness on the Wafer Backside
Pei-feng HsuandRobert
,
Mechanical andAerospace
International Conference on Advanced Thermal…
2007
Corpus ID: 16985304
Light scattering from rough surfaces is an area of research that has received a great deal of interest from several engineering…
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2006
2006
Ribbon Growth on Substrate and Molded Wafer-Two Low Cost Silicon Ribbon Materials for PV
S. Seren
,
G. Hahn
,
+4 authors
R. Jonczyk
IEEE World Conference on Photovoltaic Energy…
2006
Corpus ID: 44367800
This paper focuses on two very promising silicon ribbon materials currently produced for research: ribbon growth on substrate…
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2004
2004
New LDMOS Model Delivers Powerful Transistor Library— Part 2: Library Applications
R. Pengelly
,
Cree Microwave
,
L. Dunleavy
,
W. Clausen
,
T. Weller
,
L. Emmadi
2004
Corpus ID: 8515148
Last month, Part 1 of this article introduced the new CMC (Curtice/Modelithics/Cree) non-linear LDMOS FET transistor model. The…
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2001
2001
Aerial image sensor for self-calibration of wafer steppers
Tsuneyuki Hagiwara
,
Hideo Mizutani
,
N. Kondo
,
J. Inoue
,
Koji Kaneko
,
Shunichi Higashibata
SPIE Advanced Lithography
2001
Corpus ID: 109710918
The requirement for higher resolution is pushing up the NA of the projection lens. As a result, DOF becomes shallower, and the…
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1996
1996
Wafer-Stepper mit einer Schnittstelle
Chung-Jae Yongin Lee
,
Soon Jong Park
,
Y. Park
,
Jong-Sun Yongin Yun
1996
Corpus ID: 132419994
Wafer-Stepper mit einer Schnittstelle (200), einer Kammereinheit (100) und einer Haupteinheit (300), die eine Steuerlogik zum…
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1995
1995
Epitaxie-Wafer für eine lichtemittierende Diode
Shigetaka Murasato
,
Koichi Hasegawa
1995
Corpus ID: 141435575
1987
1987
Prüfeinrichtung zur Wafer-Prüfung
G. Krüger
1987
Corpus ID: 104738165
Prufeinrichtung zum Prufen von Chips aufweisende Wafers (35) auf elektrische Fehlerfreiheit der Chips. Sie weist eine an einem…
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