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Value network analysis
Known as:
VNA
Value network analysis is a methodology for understanding, using, visualizing, optimizing internal and external value networks and complex economic…
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Related topics
Related topics
7 relations
Business ecosystem
Network-centric organization
Social network analysis
System dynamics
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Broader (1)
Enterprise modelling
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2018
2018
Efficient Uncertainty Evaluation of Vector Network Analyser Measurements Using Two-Tier Bayesian Analysis and Monte Carlo Method
Min Wang
,
Yongjiu Zhao
,
T. Loh
,
Qian Xu
,
Yonggang Zhou
2018
Corpus ID: 115289674
Based on the uncertainty propagation mechanism of VNA measurements, an efficient uncertainty evaluation method for VNA…
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2017
2017
IoT-communications as a service: Actor roles on indoor wireless coverage
Mohammad Istiak Hossain
,
J. Markendahl
Internet of Things Business Models, Users, and…
2017
Corpus ID: 35366264
Internet of Things (IoT) is anticipated as a ‘game changer’ for communication service providers. Numerous IoT devices will deploy…
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2014
2014
Making the business case for continuous manufacturing in the pharmaceutical industry
Dr Tomás
,
S. Harrington
2014
Corpus ID: 52220987
On-going new technology development in continuous manufacturing (CM) has enabled the potential for significant step changes…
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2013
2013
A microwave VNA for biomedical in-line concentration measurements
M. Hofmann
,
A. Oborovski
,
R. Weigel
,
G. Fischer
,
D. Kissinger
IEEE Topical Conference on Biomedical Wireless…
2013
Corpus ID: 31193094
This paper presents a microwave (MW) test-set designed for biomedical in-line concentration measurements. The demonstrator…
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2011
2011
An improved stability broadband/mm-wave VNA structure
J. Martens
,
K. Noujeim
,
T. Roberts
ARFTG Microwave Measurement Conference
2011
Corpus ID: 21851813
In the past, the stability and quality of broadband mm-wave network analysis measurements have sometimes been challenges because…
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2010
2010
Application of Wide-Band Material Characterization Methods to Printable Electronics
Vesa Pynttäri
,
Riku M. Mäkinen
,
+6 authors
H. Jantunen
IEEE transactions on electronics packaging…
2010
Corpus ID: 13346289
In this paper, characterization methods are presented with results from test structures printed with varying printing parameters…
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2009
2009
Correction for line length errors and center-conductor-gap variation in the coaxial multiline through-reflect-line calibration
A. Lewandowski
,
W. Wiatr
ARFTG Microwave Measurement Conference
2009
Corpus ID: 36789979
We present an extension of the coaxial multiline through-reflect-line calibration method which allows to correct for line length…
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2007
2007
LRM: A quantitative look at reference impedance contradictions and other uncertainty impacts
J. Martens
69th ARFTG Conference
2007
Corpus ID: 42757627
LRM and its derivatives have been popular VNA calibration techniques, particularly on-wafer, for many years. The quantitative…
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2006
2006
Characterization Accuracy of High-Q Reactors Using Broadband Reflection/Transmission Measurement Techniques
A. Deleniv
,
S. Gevorgian
European Microwave Conference
2006
Corpus ID: 32656410
Characterization accuracy of high-Q reactors due to measurement uncertainties is analyzed in this paper. Two broadband techniques…
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2000
2000
Using data visualisation techniques to explore the random error distribution of two-port VNA measurements.
M. Salter
,
N. Ridler
,
J. Stewart
2000
Corpus ID: 195502338
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