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Transistor model
Known as:
Transistor Models
, Transistor parameters
The modern transistor has an internal structure that exploits complex physical mechanisms. Device design requires a detailed understanding of how…
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Related topics
Related topics
22 relations
BIBO stability
Bandwidth (signal processing)
Curve fitting
Electronic circuit simulation
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Broader (1)
Electronic engineering
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
A circuit simulation model for V-groove SiC power MOSFET
Michihiro Shintani
,
Kazuki Oishi
,
R. Zhou
,
Masayuki Hiromoto
,
Takashi Sato
IEEE Workshop on Wide Bandgap Power Devices and…
2016
Corpus ID: 16307074
In this paper, a novel circuit simulation model for V-groove SiC power MOSFET with buried P-layers is proposed. By considering…
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2008
2008
Optimal Voltage Scaling, Repeater Insertion, and Wire Sizing for Wave-Pipelined Global Interconnects
Vinita V. Deodhar
,
Jeffrey A. Davis
IEEE Transactions on Circuits and Systems Part 1…
2008
Corpus ID: 4598521
The simultaneous application of voltage scaling, repeater insertion, and wire sizing is proposed in this paper to achieve high…
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Highly Cited
2004
Highly Cited
2004
Monolithic Integration of Carbon Nanotube Devices with Silicon MOS Technology
Yu-Chih Tseng
,
Peiqi Xuan
,
+4 authors
H. Dai
2004
Corpus ID: 1560670
An integrated circuit combining single-walled carbon nanotube (SWNT) devices with n-channel metal oxide semiconductor (NMOS…
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2004
2004
Intermodulation distortion of a bipolar common-emitter amplifier with arbitrary emitter impedance and input matching network
G. Hurkx
,
E. V. D. Heijden
IEEE Transactions on Circuits and Systems Part 1…
2004
Corpus ID: 9117869
In this paper, concise formulas for the intermodulation distortion of a bipolar common-emitter amplifier stage with arbitrary…
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2003
2003
Linear model-based error identification and calibration for data converters
C. Wegener
,
Michael Peter Kennedy
Design, Automation and Test in Europe Conference…
2003
Corpus ID: 16621931
For the example of a 12-bit Nyquist-rate ADC, a model for nonlinearity-causing mechanisms is developed based on circuit…
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1998
1998
Concurrent technology, device, and circuit development for EEPROMs
U. Feldmann
,
R. Kakoschke
,
M. Miura-Mattausch
,
G. Schraud
SISPAD '97. International Conference on…
1998
Corpus ID: 15497517
Circuit simulation enters into a new stage of enhanced importance. From the conventional circuit simulator for circuit design an…
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1982
1982
Substrate Current Modeling for Circuit Simulation
J. Mar
,
Sheau-Suey Li
,
Swei-Yam Yu
IEEE Transactions on Computer-Aided Design of…
1982
Corpus ID: 7501558
A new circuit simulation model is presented for impact ionization generated MOSFET substrate current. The model uses four…
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1976
1976
Rapid determination of emitter- and collector-bulk resistances
J.S.T. Huang
1976
Corpus ID: 62655928
A technique is presented to rapidly determine the emitter and collector resistances in an integrated bipolar structure. This…
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1975
1975
Substrate fed logic
V. Blatt
,
P. Walsh
,
L. W. Kennedy
1975
Corpus ID: 61488407
A novel form of integrated injection logic (I/SUP 2/L) is described, in which the device structure has been designed specifically…
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1973
1973
Distortion analysis of bipolar transistor circuits
Y. Kuo
1973
Corpus ID: 110966832
In the design of long-haul analog communication systems, it is essential to understand the nonlinear distortion behavior of the…
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