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Tolnaftate 10 MG/ML Topical Solution [Ongo-Fin]
Known as:
Ongo-Fin 1 % Topical Solution
, Ongo-Fin 10 MG/ML Topical Solution
, TOLNAFTATE 1 mL in 100 mL TOPICAL LIQUID [Ongo - Fin]
National Institutes of Health
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7 relations
Acetone
Propylene glycol
Tolnaftate
Topical Solution
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2017
2017
Analysis of Transient Thermal Stresses in Annular Fin
H. Baş
,
I. Keles
2017
Corpus ID: 73546792
The thermal stresses of annular fin with its base subjected of a decayed exponential function of time is examined in this study…
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2017
2017
A novel finbox EHBTFET for low power applications
Ashita
,
S. Loan
,
M. Rafat
International conference on Microelectronic…
2017
Corpus ID: 9875041
In this work, for the first time we propose a Germanium on FinBOX based structure for an Electron-Hole Bilayer Tunnel FET (FB…
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2016
2016
A bio-inspired underwater glider with undulatory fin for long-duration, spatially explicit water column sampling
Daiwei Li
,
Zheng Zeng
,
Junliang Cao
,
Di Lu
,
Chengke Xiong
,
L. Lian
IEEE/OES Autonomous Underwater Vehicles
2016
Corpus ID: 32787856
This paper presents the design and experimental evaluation of a bio-inspired underwater glider with undulatory fin, which is…
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2015
2015
Feuille d'info - Fin novembre 2015
Marie
2015
Corpus ID: 204706163
2014
2014
Min är inte fin längre! – En studie om hur barn stöttas i sitt spontana bildskapande.
Emma Säveskog
,
Anna Adamsson
2014
Corpus ID: 113781091
2013
2013
Understanding device impact of line edge/width roughness in frequency domain
P. Xie
,
He Ren
,
A. Nainani
,
H. Dai
,
C. Bencher
,
C. Ngai
Advanced Lithography
2013
Corpus ID: 121877273
Lithography pattern line-edge roughness (LER) has important device implications such as device variability, current leakage and…
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2008
2008
3-D simulation of geometrical variations impact on nanoscale FinFETs
Shimeng Yu
,
Yuning Zhao
,
+4 authors
Xiaoyan Liu
9th International Conference on Solid-State and…
2008
Corpus ID: 6325569
Intra-die fluctuations in the nanoscale CMOS technology emerge inherently to geometrical variations such as line edge roughness…
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2008
2008
Triple-gate FinFETs with Fin-thickness Optimization to Reduce the Impact of Fin Line Edge Roughness
Shimeng Yu
,
Yudi Zhao
,
G. Du
,
Jinfeng Kang
,
R. Han
,
Xiaoyan Liu
2008
Corpus ID: 55780655
Shimeng Yu, Yuning Zhao, Gang Du, Jinfeng Kang, Ruqi Han, and Xiaoyan Liu* Institute of Microelectronics, Peking University…
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1994
1994
ビジネスプロセス・リエンジニアリングを強力に支援する onGO (グル-プウェアで組織戦力を上げる )
杉林 哲也
1994
Corpus ID: 175814989
1974
1974
PREFABRICATED, FIN UNDERDRAIN PROMISES FASTER SOIL DRAINAGE
K. Healy
,
R. Long
1974
Corpus ID: 106573262
The design and methods of installation of a prefabricated filter media for use with subsurface drains is presented. The filter…
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