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Three-valued logic
Known as:
Triple-value logic
, Triple-valued logic
, Trinary logic
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In logic, a three-valued logic (also trinary logic, trivalent, ternary, or trilean, sometimes abbreviated 3VL) is any of several many-valued logic…
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Related topics
Related topics
21 relations
Balanced ternary
Boolean algebra
Codd's theorem
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
Modelling of the operation process of repairable technical objects with the use information from an artificial neural network
S. Duer
Expert systems with applications
2011
Corpus ID: 32855534
2005
2005
Three-valued logic in bounded model checking
T. Schüle
,
K. Schneider
Proceedings. Second ACM and IEEE International…
2005
Corpus ID: 2748060
In principle, bounded model checking (BMC) leads to semi-decision procedures that can be used to verify liveness properties and…
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Review
2005
Review
2005
Purex co-processing of spent LWR fuels: flow sheet
Okan H. Zabunogˇlu
,
Levent Özdemir
2005
Corpus ID: 44758258
2004
2004
A novel multiple-valued logic design using ballistic carbon nanotube FETs
A. Raychowdhury
,
K. Roy
Proceedings. 34th International Symposium on…
2004
Corpus ID: 21285463
This paper presents a novel method of multiple-valued logic design using carbon nanotube FETs (CNFETs). The geometry dependant…
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2002
2002
A note on Lukasiewicz’s three-valued logic
Pierluigi Minari
2002
Corpus ID: 120558845
It is well known that Lukasiewicz’s three-valued-logic L3 admits – unlike classical logic – the definition of two non trivial…
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2001
2001
An Expert System for Managing Medical Appropriateness Criteria Based on Computer Algebra Techniques
Luis M. Laita
,
E. Roanes-Lozano
,
V. Maojo
,
Eugenio Roanes-Macías
,
L. Ledesma
,
Laura Laita
2001
Corpus ID: 62750855
Highly Cited
1995
Highly Cited
1995
Self-timed is self-checking
I. David
,
R. Ginosar
,
M. Yoeli
Journal of electronic testing
1995
Corpus ID: 9561165
Self-checking circuits detect (at least some of) their own faults. We describe self-timed circuits, including combinational logic…
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1994
1994
Time-efficient automatic test pattern generation systems
B. So
1994
Corpus ID: 60036199
Automatic Test Pattern Generation (ATPG) systems are tools for generating tests for digital circuits. Due to the complexity of…
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1976
1976
Flip-Flops for Multiple-Valued Logic
Thurman A. Irving
,
S. Shiva
,
H. Nagle
IEEE transactions on computers
1976
Corpus ID: 34323423
A family of multiple-valued (MV) electronic memory elements, referred to herein as flip-flops, is presented along with a system…
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Highly Cited
1972
Highly Cited
1972
A Note on Three-Valued Logic Simulation
M. Breuer
IEEE transactions on computers
1972
Corpus ID: 43629740
In this note we discuss a few attributes and pitfalls of three-valued (0, 1, u) digital logic simulation. The areas covered…
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