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Texture mapping unit
Known as:
Texture-mapping unit
, TMU
, Texture mapping units
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A texture mapping unit (TMU) is a component in modern graphics processing units (GPUs), historically it was a separate physical processor. A TMU is…
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Related topics
Related topics
44 relations
AMD Radeon Rx 200 series
ARM Cortex-A15
ATI video card suffixes
ATi Radeon R300 Series
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Broader (1)
Graphics hardware
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2016
2016
L-Bench: An Android benchmark set for low-power mobile GPUs
Jae-Ho Nah
,
Youngsun Suh
,
Yeongkyu Lim
Computers & graphics
2016
Corpus ID: 34594728
2014
2014
Impact of shrinking measurement error budgets on qualification metrology sampling and cost
M. Sendelbach
,
Niv Sarig
,
+7 authors
C. Archie
Advanced Lithography
2014
Corpus ID: 122621440
When designing an experiment to assess the accuracy of a tool as compared to a reference tool, semiconductor metrologists are…
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2010
2010
Aggregate Statistics of National Traffic Management Initiatives
J. Rios
2010
Corpus ID: 167327449
Balancing traffic demand and capacity in the National Airspace System is accomplished through the use of various Traffic…
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Highly Cited
2007
Highly Cited
2007
Movement-Aware Vertical Handoff of WLAN and Mobile WiMAX for Seamless Ubiquitous Access
Wonjun Lee
,
Eunkyo Kim
,
Joongheon Kim
,
Inkyu Lee
,
Choonhwa Lee
IEEE transactions on consumer electronics
2007
Corpus ID: 20396986
This paper addresses a movement-aware vertical (MAV) handover algorithm between WLAN and Mobile WiMAX for seamless ubiquitous…
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2007
2007
RVERL: Run-time Verification of Real-time and Reactive Programs using Event-based Real-Time Logic Approach
S. Jalili
,
Mehdi MirzaAghaei
International Conference on Software Engineering…
2007
Corpus ID: 15906465
Conventional software verification and validation (V&V) approaches for real-time and reactive programs are not practical because…
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2006
2006
A comprehensive test of optical scatterometry readiness for 65-nm technology production
V. Ukraintsev
SPIE Advanced Lithography
2006
Corpus ID: 108886600
Measurement bias is a central concept of critical dimension (CD) metrology. Bias is a complex function of sample, tool and time…
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2006
2006
VLSI Implementation of 1/2 Viterbi Decoder for IEEE P802.15-3a UWB Communication
M. Siswanto
,
M. Othman
,
E. Zahedi
IEEE International Conference on Semiconductor…
2006
Corpus ID: 30053071
This paper presents the design of 1/2 Viterbi decoder for UWB applications following the standard requirements of IEEE P802.15-3a…
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2004
2004
Reducing measurement uncertainty drives the use of multiple technologies for supporting metrology
Bill Banke
,
C. Archie
,
+6 authors
E. Solecky
SPIE Advanced Lithography
2004
Corpus ID: 110702909
Perhaps never before in semiconductor microlithography has there been such an interest in the accuracy of measurement. This…
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2001
2001
A TIME-BASED APPROACH TO METERING ARRIVAL TRAFFIC TO PHILADELPHIA
Todd Parley
,
J. Foster
,
Ty Hoang
,
Katharine K. Lee
2001
Corpus ID: 51932948
Time-based metering via the Traffic Management Advisor (TMA) has significantly improved arrival operations at capacity…
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1998
1998
On-line quantitative determination of2H/1H isotope ratios in organic and water samples using an elemental analyser coupled to an isotope ratio mass spectrometer
S. Kelly
,
I. Parker
,
M. Sharman
,
M. Dennis
1998
Corpus ID: 42273270
A rapid continuous-flow technique for the quantitative determination of hydrogen isotope ratios in organic materials and water…
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