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Test data

Test data is data which has been specifically identified for use in tests, typically of a computer program. Some data may be used in a confirmatory… 
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Related topics

Related topics

9 relations
Software constructionSoftware testingStorage efficiencyString generation

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Highly Cited
2008
Highly Cited
2008
Measurement-Based Timing Analysis
In this paper we present a measurement-based worst-case execution time (WCET) analysis method. Exhaustive end-to-end execution… 
Highly Cited
2007
Highly Cited
2007
X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR
  • N. Touba
  • IEEE International Test Conference
  • 2007
  • Corpus ID: 14643713
A new X-tolerant multiple-input signature register (MISR) compaction methodology is proposed which can compact output streams… 
Highly Cited
2007
Highly Cited
2007
Input files with ORNL - mathematical phantoms of the human body for MCNP-4B
Highly Cited
2006
Highly Cited
2006
Neural network and GA approaches for dwelling fire occurrence prediction
Highly Cited
2003
Highly Cited
2003
Towards Semantic Web Information Extraction
The approach towards Semantic Web Information Extraction (IE) presented here is implemented in KIM – a platform for semantic… 
Highly Cited
2003
Highly Cited
2003
Strategies for the Increased Robustness of Ant-Based Clustering
This paper introduces a set of algorithmic modifications that improve the partitioning results obtained with ant-based clustering… 
Highly Cited
2002
Highly Cited
2002
Test power reduction through minimization of scan chain transitions
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average… 
Highly Cited
2001
Highly Cited
2001
Particle tracking using CMOS monolithic active pixel sensor
Highly Cited
2001
Highly Cited
2001
Fault Diagnosis of Analog Circuits Using Bayesian Neural Networks with Wavelet Transform as Preprocessor
We have developed an analog circuit fault diagnostic system based on Bayesian neural networks using wavelet transform… 
Highly Cited
2000
Highly Cited
2000
Noun Phrase Recognition by System Combination
The performance of machine learning algorithms can be improved by combining the output of different systems. In this paper we… 
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