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Test data
Test data is data which has been specifically identified for use in tests, typically of a computer program. Some data may be used in a confirmatory…
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Related topics
Related topics
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Software construction
Software testing
Storage efficiency
String generation
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Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
An Efficient Algorithm for Generating Classification Rules
S. Vijayarani
,
M. Divya
2011
Corpus ID: 17698272
Data mining is the process of extracting hidden knowledge from the large data repositories. In data mining, there are several…
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Review
2010
Review
2010
Automated assessment of ESOL free text examinations
Ted Briscoe
,
Ben Medlock
,
Øistein E. Andersen
2010
Corpus ID: 16253657
In this report, we consider the task of automated assessment of English as a Second Language (ESOL) examination scripts written…
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Highly Cited
2007
Highly Cited
2007
Input files with ORNL - mathematical phantoms of the human body for MCNP-4B
D. Krstić
,
D. Nikezic
Computer Physics Communications
2007
Corpus ID: 42042405
Highly Cited
2006
Highly Cited
2006
Neural network and GA approaches for dwelling fire occurrence prediction
Lili Yang
,
C. Dawson
,
Martin R. Brown
,
M. Gell
Knowledge-Based Systems
2006
Corpus ID: 7693713
Highly Cited
2006
Highly Cited
2006
At-Speed Structural Test For High-Performance ASICs
V. Iyengar
,
Toshihiko Yokota
,
+9 authors
F. Woytowich
IEEE International Test Conference
2006
Corpus ID: 32319750
At-speed test of integrated circuits is becoming critical to detect subtle delay defects. Existing structural at-speed test…
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2004
2004
A Foreign Object Damage Event Detector Data Fusion System for Turbofan Engines
J. Turso
,
J. Litt
Journal of Aerospace Computing Information and…
2004
Corpus ID: 16258644
Abstract : A Data Fusion System designed to provide a reliable assessment of the occurrence of Foreign Object Damage (FOD) in a…
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2004
2004
3-stage variable length continuous-flow scan vector decompression scheme
C. V. Krishna
,
N. Touba
22nd IEEE VLSI Test Symposium, . Proceedings.
2004
Corpus ID: 8009198
This paper presents a 3-stage continuous-flow linear decompression scheme for scan vectors that uses a variable number of bits to…
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Highly Cited
2003
Highly Cited
2003
Towards Semantic Web Information Extraction
Borislav Popov
,
A. Kiryakov
,
D. Manov
,
A. Kirilov
,
Damyan Ognyanoff
,
Miroslav Goranov
2003
Corpus ID: 18426229
The approach towards Semantic Web Information Extraction (IE) presented here is implemented in KIM – a platform for semantic…
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Highly Cited
2002
Highly Cited
2002
Test power reduction through minimization of scan chain transitions
O. Sinanoglu
,
I. Bayraktaroglu
,
A. Orailoglu
Proceedings 20th IEEE VLSI Test Symposium (VTS )
2002
Corpus ID: 7131991
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average…
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2000
2000
Speaker verification over the telephone
L. Lamel
,
J. Gauvain
Speech Communication
2000
Corpus ID: 16368628
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