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Test data

Test data is data which has been specifically identified for use in tests, typically of a computer program. Some data may be used in a confirmatory… 
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Related topics

Related topics

9 relations
Software constructionSoftware testingStorage efficiencyString generation

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2011
2011
An Efficient Algorithm for Generating Classification Rules
Data mining is the process of extracting hidden knowledge from the large data repositories. In data mining, there are several… 
Highly Cited
2007
Highly Cited
2007
X-canceling MISR — An X-tolerant methodology for compacting output responses with unknowns using a MISR
  • N. Touba
  • IEEE International Test Conference
  • 2007
  • Corpus ID: 14643713
A new X-tolerant multiple-input signature register (MISR) compaction methodology is proposed which can compact output streams… 
Highly Cited
2007
Highly Cited
2007
Input files with ORNL - mathematical phantoms of the human body for MCNP-4B
Highly Cited
2006
Highly Cited
2006
Neural network and GA approaches for dwelling fire occurrence prediction
Highly Cited
2006
Highly Cited
2006
At-Speed Structural Test For High-Performance ASICs
At-speed test of integrated circuits is becoming critical to detect subtle delay defects. Existing structural at-speed test… 
Highly Cited
2004
Highly Cited
2004
Response-based decision trees to trigger one-shot stabilizing control
This paper describes a method for developing response-based decision trees (DTs) to trigger stabilizing control. The DT inputs… 
2004
2004
A Foreign Object Damage Event Detector Data Fusion System for Turbofan Engines
Abstract : A Data Fusion System designed to provide a reliable assessment of the occurrence of Foreign Object Damage (FOD) in a… 
Highly Cited
2003
Highly Cited
2003
Towards Semantic Web Information Extraction
The approach towards Semantic Web Information Extraction (IE) presented here is implemented in KIM – a platform for semantic… 
Highly Cited
2002
Highly Cited
2002
Test power reduction through minimization of scan chain transitions
Parallel test application helps reduce the otherwise considerable test times in SOCs; yet its applicability is limited by average… 
Highly Cited
1996
Highly Cited
1996
Closure of "Algebraic Methods For Creep Analysis of Continuous Composite Beams"
This paper proposes a simplified time-dependent analysis for continuous steel-concrete composite beams with flexible shear… 
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