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Scanning joule expansion microscopy

Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature… Expand
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Atomic-force microscopy

Papers overview

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2015
2015
Three-Dimensional Stateful Material Implication Logic
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy… Expand
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2013
2013
Thermomechanical Modeling of Scanning Joule Expansion Microscopy Imaging of Single-Walled Carbon Nanotube Devices
An analytical model, validated by experiments and finite element simulations, is developed to study the thermal imaging of single… Expand
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2011
2011
Nanoscale thermally induced strain and stress analysis by complementary Scanning Thermal Microscopy Techniques
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and… Expand
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2010
2010
Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques
Thermally induced stress is determined using boundary values obtained by complementary Scanning Joule Expansion Microscopy and… Expand
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2009
2009
Advanced dynamic failure analysis on interconnects by vectorized Scanning Joule Expansion microscopy
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the… Expand
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2009
2009
Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations
Thermo-elastic properties on aluminum interconnects are characterized by Scanning Joule Expansion Microscopy and complementary… Expand
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2007
2007
Joule expansion imaging techniques on microlectronic devices
We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule… Expand
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2005
2005
Scanning Joule Expansion Microscopy of a Constriction in Thin Metallic Film
Figure 1: Scanning Joule Expansion Microscopy (SJEM ) setup. The interconnect is periodically heated to i nduce a vertical… Expand
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2001
2001
Scanning Joule expansion microscopy as a tool for studying local heating phenomena
Abstract : Scanning Joule expansion microscopy (SJEM) is a powerful technique enabling the generation of temperature maps of… Expand
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1999
1999
Investigation of self-heating phenomenon in small geometry vias using scanning Joule expansion microscopy
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady… Expand
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