Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 238,935,632 papers from all fields of science
Search
Sign In
Create Free Account
Scanning joule expansion microscopy
Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
1 relation
Atomic-force microscopy
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Three-Dimensional Stateful Material Implication Logic
G. Adam
,
B. Hoskins
,
M. Prezioso
,
D. Strukov
arXiv.org
2015
Corpus ID: 14225174
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy…
Expand
2015
2015
Thermal Engineering of GaN Semiconductor Devices
S. Graham
2015
Corpus ID: 111037082
The development of gallium nitride (GaN) on a variety of substrates from SiC to diamond is under development to create high power…
Expand
2012
2012
Approaches for alignment and purification of single walled carbon nanotube thin films and their application in device electronics
S. Dunham
2012
Corpus ID: 138619236
2011
2011
Quantitative nanometer-scale thermal metrology using scanning joule expansion microscopy
K. L. Grosse
2011
Corpus ID: 136293737