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Scanning joule expansion microscopy
Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature…
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Atomic-force microscopy
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2015
2015
Three-Dimensional Stateful Material Implication Logic
G. Adam
,
B. Hoskins
,
M. Prezioso
,
D. Strukov
arXiv.org
2015
Corpus ID: 14225174
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy…
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2015
2015
Thermal Engineering of GaN Semiconductor Devices
S. Graham
2015
Corpus ID: 111037082
The development of gallium nitride (GaN) on a variety of substrates from SiC to diamond is under development to create high power…
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2012
2012
Approaches for alignment and purification of single walled carbon nanotube thin films and their application in device electronics
S. Dunham
2012
Corpus ID: 138619236
2011
2011
Nanoscale thermally induced strain and stress analysis by complementary Scanning Thermal Microscopy Techniques
M. Fakhri
,
A. Geinzer
,
R. Heiderhoff
,
L. Balk
International Symposium on the Physical and…
2011
Corpus ID: 15746980
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and…
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2011
2011
Quantitative nanometer-scale thermal metrology using scanning joule expansion microscopy
K. L. Grosse
2011
Corpus ID: 136293737
2009
2009
Advanced dynamic failure analysis on interconnects by vectorized Scanning Joule Expansion microscopy
A.-K. Tiedemann
,
M. Fakhri
,
R. Heiderhoff
,
J. Phang
,
L. Balk
16th IEEE International Symposium on the Physical…
2009
Corpus ID: 17635869
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the…
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1999
1999
Investigation of self-heating phenomenon in small geometry vias using scanning Joule expansion microscopy
K. Banerjee
,
G. Wu
,
M. Igeta
,
A. Amerasekera
,
A. Majumdar
,
C. Hu
IEEE International Reliability Physics Symposium…
1999
Corpus ID: 10891735
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady…
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