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Scanning joule expansion microscopy

Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature… 
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Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy… 
2013
2013
An analytical model, validated by experiments and finite element simulations, is developed to study the thermal imaging of single… 
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2011
2011
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and… 
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2010
2010
Thermally induced stress is determined using boundary values obtained by complementary Scanning Joule Expansion Microscopy and… 
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2009
2009
Thermo-elastic properties on aluminum interconnects are characterized by Scanning Joule Expansion Microscopy and complementary… 
2009
2009
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the… 
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2007
2007
We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule… 
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2005
2005
Figure 1: Scanning Joule Expansion Microscopy (SJEM ) setup. The interconnect is periodically heated to i nduce a vertical… 
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2001
2001
Abstract : Scanning Joule expansion microscopy (SJEM) is a powerful technique enabling the generation of temperature maps of… 
1999
1999
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady… 
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