Scanning joule expansion microscopy

Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature… (More)
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2015
2015
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy… (More)
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2013
2013
  • Jizhou Song, Chaofeng Lü, +7 authors John A. Rogers
  • 2013
An analytical model, validated by experiments and finite element simulations, is developed to study the thermal imaging of single… (More)
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2011
2011
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and… (More)
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2010
2010
0026-2714/$ see front matter 2010 Elsevier Ltd. A doi:10.1016/j.microrel.2010.07.134 * Corresponding author. Tel.: +49 202 439… (More)
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2009
2009
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the… (More)
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2007
2007
We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule… (More)
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2000
2000
Thermal characteristics of submicron vias strongly impact reliability of multilevel VLSI interconnects. The magnitude and spatial… (More)
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1999
1999
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady… (More)
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