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Scanning joule expansion microscopy

Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature… 
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Papers overview

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2015
2015
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy… 
2015
2015
The development of gallium nitride (GaN) on a variety of substrates from SiC to diamond is under development to create high power… 
2011
2011
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and… 
2009
2009
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the… 
1999
1999
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady…