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Scanning joule expansion microscopy

Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature… Expand
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Papers overview

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2015
2015
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy… Expand
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2013
2013
An analytical model, validated by experiments and finite element simulations, is developed to study the thermal imaging of single… Expand
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2011
2011
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and… Expand
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2010
2010
Thermally induced stress is determined using boundary values obtained by complementary Scanning Joule Expansion Microscopy and… Expand
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2009
2009
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the… Expand
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2009
2009
Thermo-elastic properties on aluminum interconnects are characterized by Scanning Joule Expansion Microscopy and complementary… Expand
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2007
2007
We have studied the electrically induced off-plane surface displacement on two microelectronic devices using Scanning Joule… Expand
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2005
2005
Figure 1: Scanning Joule Expansion Microscopy (SJEM ) setup. The interconnect is periodically heated to i nduce a vertical… Expand
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2001
2001
Abstract : Scanning Joule expansion microscopy (SJEM) is a powerful technique enabling the generation of temperature maps of… Expand
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1999
1999
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady… Expand
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