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Scanning joule expansion microscopy

Scanning Joule Expansion Microscopy is a form of scanning probe microscopy heavily based on atomic force microscopy that maps the temperature… 
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Related topics

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Atomic-force microscopy

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
Three-Dimensional Stateful Material Implication Logic
Monolithic three-dimensional integration of memory and logic circuits could dramatically improve performance and energy… 
2015
2015
Thermal Engineering of GaN Semiconductor Devices
The development of gallium nitride (GaN) on a variety of substrates from SiC to diamond is under development to create high power… 
2012
2012
Approaches for alignment and purification of single walled carbon nanotube thin films and their application in device electronics
2011
2011
Nanoscale thermally induced strain and stress analysis by complementary Scanning Thermal Microscopy Techniques
The miniaturization of integrated circuits is coupled with increased power dissipation and associated thermal and… 
2011
2011
Quantitative nanometer-scale thermal metrology using scanning joule expansion microscopy
2009
2009
Advanced dynamic failure analysis on interconnects by vectorized Scanning Joule Expansion microscopy
Vertical and lateral Scanning Joule Expansion Microscopy measurements are compared for the first time. Frequency behaviors of the… 
1999
1999
Investigation of self-heating phenomenon in small geometry vias using scanning Joule expansion microscopy
This paper reports the use of a novel thermometry technique, scanning Joule expansion microscopy (SJEM), to study the steady… 
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