Skip to search formSkip to main contentSkip to account menu

Reflectometry

Reflectometry is a noninvasive technique that allows the analysis of properties of a medium. This technique is based on the reflection of waves at… 
Wikipedia (opens in a new tab)

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2015
2015
The dependence of the structure of a phospholipid layer (DSPC and SOPC) adsorbed on a hydrosol substrate on the concentration of… 
2014
2014
In this paper, we investigate the efficiency enhancement of blue InGaN/GaN light-emitting diodes (LEDs) by incorporating a… 
Highly Cited
2010
Highly Cited
2010
The aggregative adsorption of a nonionic surfactant (C12E5) in the cylindrical pores of SBA-15 ordered mesoporous silica (pore… 
2010
2010
Cationic and zwitterionic polyelectrolyte brushes on quartz substrate were synthesized by surface-initiated atom transfer radical… 
Highly Cited
2008
Highly Cited
2008
In paper metrological aspects of symmetric double frequency and multi frequency reflectometry for Bragg structures are considered… 
2005
2005
The bonding sensitivities of Si–N and Si–C bonds in the a-SiCN thin films were investigated experimentally and theoretically. It… 
2001
2001
Abstract:The complexation and the distribution of various cations, bound to a poly(styrene sulfonate) brush, have been…