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Reflectometry

Reflectometry is a noninvasive technique that allows the analysis of properties of a medium. This technique is based on the reflection of waves at… (More)
Wikipedia

Topic mentions per year

Topic mentions per year

1975-2018
010020019752018

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10 relations
Data acquisitionMedical imagingRadarRefractive index and extinction coefficient of thin film materials
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Broader (1)

Electronic engineering

Related mentions per year

Related mentions per year

1941-2018
19401960198020002020
Reflectometry
Semiconductor
Radar
Medical imaging
Transmission line
Data acquisition

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
Review
2016
Review
2016
GEROS-ISS: GNSS REflectometry, Radio Occultation, and Scatterometry Onboard the International Space Station
GEROS-ISS stands for GNSS REflectometry, radio occultation, and scatterometry onboard the International Space Station (ISS). It… (More)
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2011
2011
Pocket reflectometry
We present a simple, fast solution for reflectance acquisition using tools that fit into a pocket. Our method captures video of a… (More)
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Highly Cited
2010
Highly Cited
2010
Blind Reflectometry
We address the problem of inferring homogeneous reflectance (BRDF) from a single image of a known shape in an unknown real-world… (More)
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2010
2010
Condenser-Based Instant Reflectometry
We present a technique for rapid capture of high quality bidirectional reflection distribution functions(BRDFs) of surface points… (More)
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2010
2010
Circularly polarized spherical illumination reflectometry
We present a novel method for surface reflectometry from a few observations of a scene under a single uniform spherical field of… (More)
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Highly Cited
2008
Highly Cited
2008
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for… (More)
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2006
2006
Multicarrier reflectometry
A new reflectometry method called multicarrier reflectometry (MCR) for fault location in cables is proposed. MCR combines a… (More)
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Highly Cited
2005
Highly Cited
2005
Analysis of spread spectrum time domain reflectometry for wire fault location
Spread spectrum time domain reflectometry (SSTDR) and sequence time domain reflectometry have been demonstrated to be effective… (More)
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Highly Cited
2003
Highly Cited
2003
Linear light source reflectometry
This paper presents a technique for estimating the spatially-varying reflectance properties of a surface based on its appearance… (More)
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2000
2000
Spectroscopic ellipsometry and reflectometry: a user's perspective
We discuss how analytical tools in a characterization lab can be used to enhance metrology tools in a fab. The emphasis is on the… (More)
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