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Reflectometry

Reflectometry is a noninvasive technique that allows the analysis of properties of a medium. This technique is based on the reflection of waves at… Expand
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Related topics

Related topics

10 relations
Data acquisitionMedical imagingRadarRefractive index and extinction coefficient of thin film materials
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Broader (1)

Electronic engineering

Papers overview

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Highly Cited
2010
Highly Cited
2010
Blind Reflectometry
We address the problem of inferring homogeneous reflectance (BRDF) from a single image of a known shape in an unknown real-world… Expand
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Highly Cited
2008
Highly Cited
2008
Passive Reflectometry
Different materials reflect light in different ways, so reflectance is a useful surface descriptor. Existing systems for… Expand
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Highly Cited
2008
Highly Cited
2008
Metrological aspects of symmetric double frequency and multi frequency reflectometry for fiber Bragg structures
In paper metrological aspects of symmetric double frequency and multi frequency reflectometry for Bragg structures are considered… Expand
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2006
2006
Noncontact Probes for Wire FaultLocation With Reflectometry
This paper describes an approach to locate wire faults using reflectometry without physical contact with the wire conductor. This… Expand
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Highly Cited
2005
Highly Cited
2005
Narrow linewidth fiber laser for 100-km optical frequency domain reflectometry
A diode-pumped single-frequency piezoelectrically tuned fiber laser with narrow spectral linewidth has been used as a light… Expand
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Highly Cited
2005
Highly Cited
2005
Direct measurement of zonal flows and geodesic acoustic mode oscillations in ASDEX Upgrade using Doppler reflectometry
Zonal flows (ZFs) and associated geodesic oscillations are turbulence-generated time-varying Er × BT rigid poloidal plasma flows… Expand
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Highly Cited
2005
Highly Cited
2005
Application of time-frequency domain reflectometry for detection and localization of a fault on a coaxial cable
In this paper, we introduce a new high-resolution reflectometry technique that operates simultaneously in both the time and… Expand
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Highly Cited
2003
Highly Cited
2003
Linear light source reflectometry
This paper presents a technique for estimating the spatially-varying reflectance properties of a surface based on its appearance… Expand
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Highly Cited
2000
Highly Cited
2000
Crosslinked polydimethylsiloxane exposed to oxygen plasma studied by neutron reflectometry and other surface specific techniques
  • H. Hillborga, J. F. Anknerc, U. W. Geddea, G. D. Smithd, H. K. Yasudae, K. Wikströma
  • 2000
    • Corpus ID: 51804229
Spin-coated specimens of crosslinked polydimethylsiloxane (PDMS) exposed to radio-frequency (RF) and microwave (MW) oxygen plasma… Expand
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1991
1991
Polarized neutron reflectometry
Abstract Polarized neutron reflectometry is a powerful technique for studying the microscopic magnetic structures in thin films… Expand
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