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Redundant array of independent memory

Known as: RAIM 
A redundant array of independent memory (RAIM) is a design feature found in certain computers' main random access memory. RAIM utilizes additional… 
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Related topics

Related topics

7 relations
ChipkillComputerData stripingECC memory

Broader (2)

Computer memoryError detection and correction

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2017
2017
An adapted RAIM algorithm for urban canyon environment
Receiver Autonomous Integrity Monitoring (RAIM) has been successfully used for fault detection and exclusion in aviation… 
2013
2013
Results on the Optimal Detection Statistic for Integrity Monitoring
One of the most stringent requirements of positioning systems for aviation is integrity. The provision of integrity is the main… 
2012
2012
IBM zEnterprise redundant array of independent memory subsystem
The IBM zEnterprise® system introduced a new and innovative redundant array of independent memory (RAIM) subsystem design as a… 
2011
2011
Integrity Risk of Kalman Filter-Based RAIM
This paper introduces a new Kalman filter-based receiver autonomous integrity monitoring (RAIM) method for navigation systems… 
2007
2007
Standalone GPS-Based Flight Inspection System
Dr. Todd Walter received his B. S. in physics from Rensselaer Polytechnic Institute and his Ph.D. in 1993 from Stanford… 
2006
2006
An Integrity Monitoring Technique for Multiple Failures Detection
Within the next future, the advent of Galileo, GPS modernization and of the GNSS augmentation systems, will lead to a rapid… 
2006
2006
Galileo-GPS RAIM for Vertical Guidance
In the next ten years the number of pseudorange sources and their quality is expected to increase dramatically: The United States… 
2005
2005
Advanced RAIM Algorithms: First Results
2001
2001
Use of multicorrelator techniques for interference detection
The interference is among the most feared events in civil aviation use of GNSS. A large number of techniques were designed to… 
1984
1984
New Failure Mechanisms in Sputtered Aluminum-Silicon Films
A new failure mechanism resulting in open metal bit- lines was observed during reliability testing of vendor 64k dynamic random… 
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