Skip to search form
Skip to main content
Skip to account menu
Semantic Scholar
Semantic Scholar's Logo
Search 223,673,731 papers from all fields of science
Search
Sign In
Create Free Account
Optical beam-induced current
Known as:
OBIC
, Optical beam induced current
, Optical beam-induced currents
Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser…
Expand
Wikipedia
(opens in a new tab)
Create Alert
Alert
Related topics
Related topics
2 relations
Failure analysis
Semiconductor
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Fabrication and characterization of nanodevices based on III-V nanowires
Luna bugallo
,
A. De
2012
Corpus ID: 135900087
Semiconductor nanowires are nanostructures with lengths up to few microns and small cross sections (10ths of nanometers). In the…
Expand
2011
2011
Near-field optical beam induced current (NOBIC) characteristics of a GaAs solar cell with biomimetic antireflective structures
Cheng-Ying Yang
,
M. Tsai
,
P. Yu
37th IEEE Photovoltaic Specialists Conference
2011
Corpus ID: 30769528
Photoelectric conversion characteristics of a GaAs solar cell with biomimetic antireflective nanostructure are investigated by…
Expand
Review
2010
Review
2010
Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy
A. Cavallini
,
L. Polenta
,
A. Castaldini
Microelectronics and reliability
2010
Corpus ID: 32146922
2010
2010
Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical-Beam-Induced-Current Technique
T. Takeshita
,
T. Sato
,
M. Mitsuhara
,
Y. Kondo
,
H. Oohashi
IEEE transactions on device and materials…
2010
Corpus ID: 19783994
The degradation of InP buried heterostructure layers in lasers during constant-power aging is investigated by using the optical…
Expand
2009
2009
CONTRIBUTION A L'EVALUATION DE LA TECHNIQUE DE GENERATION D'HARMONIQUE PAR FAISCEAU LASER POUR LA MESURE DES CHAMPS ELECTRIQUES DANS LES CIRCUITS INTEGRES (EFISHG)
T. Fernandez
2009
Corpus ID: 92694292
Ce travail contribue a l’evaluation de la technique de generation de seconde harmonique induite par un champ electrique quasi…
Expand
2005
2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
N. Guitard
,
Fabien Essely
,
+6 authors
D. Lewis
Microelectronics and reliability
2005
Corpus ID: 206943465
2003
2003
A physical approach on SCOBIC investigation in VLSI
T. Beauchêne
,
D. Lewis
,
+4 authors
Y. Danto
Microelectronics and reliability
2003
Corpus ID: 31814584
2001
2001
Advanced LIVA / TIVA Techniques
Reinhard Mayer Falk
2001
Corpus ID: 29595321
LIVA (Light Induced Voltage Alterations) and TIVA (Thermally Induced Voltage Alterations) have demonstrated significant…
Expand
Review
1995
Review
1995
Evaluation of wafer bonding and etch back for SOI technology
H. Baumgart
,
T. Letavic
,
R. Egloff
1995
Corpus ID: 60673788
1986
1986
Optical beam induced current imaging of dislocations in semiconductors
T. Wilson
,
E. Mccabe
1986
Corpus ID: 123498722
On presente une theorie de la formation d'image dans les microscopes optiques a balayage fonctionnant dans le mode OBIC. Images…
Expand
By clicking accept or continuing to use the site, you agree to the terms outlined in our
Privacy Policy
(opens in a new tab)
,
Terms of Service
(opens in a new tab)
, and
Dataset License
(opens in a new tab)
ACCEPT & CONTINUE