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Optical beam-induced current

Known as: OBIC, Optical beam induced current, Optical beam-induced currents 
Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser… 
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Related topics

2 relations
Failure analysisSemiconductor

Papers overview

Semantic Scholar uses AI to extract papers important to this topic.
2020
2020
Object-Based Image Coding: A Learning-Driven Revisit
The Object-Based Image Coding (OBIC) that was extensively studied about two decades ago, promised a vast application perspective… 
2018
2018
Using convolutional neural network to identify irregular segmentation objects from very high-resolution remote sensing imagery
Abstract. Convolutional neural network (CNN) has shown great success in computer vision tasks, but their application in land-use… 
Highly Cited
2017
Highly Cited
2017
Object-Based Land-Cover Supervised Classification for Very-High-Resolution UAV Images Using Stacked Denoising Autoencoders
Over the last decade, object-based image classification (OBIC) has become a mainstream method in remote sensing land-use/land… 
2016
2016
Optimized bi-connected federation of multiple sensor network segments
2010
2010
A Tractable and Accurate Cross-Layer Model for Multi-Hop MIMO Networks
MIMO-based communications have great potential to improve network capacity for multi-hop wireless networks. Although there has… 
2010
2010
Degradation Analysis of InP Buried Heterostructure Layers in Lasers Using Optical-Beam-Induced-Current Technique
The degradation of InP buried heterostructure layers in lasers during constant-power aging is investigated by using the optical… 
2005
2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
2003
2003
A physical approach on SCOBIC investigation in VLSI
1995
1995
NEAR-FIELD OPTICAL BEAM INDUCED CURRENT MEASUREMENTS ON HETEROSTRUCTURES
We report near‐field optical beam induced current (NOBIC) measurements on semiconductor quantum well (QW) structures. A… 
1986
1986
Optical beam induced current imaging of dislocations in semiconductors
On presente une theorie de la formation d'image dans les microscopes optiques a balayage fonctionnant dans le mode OBIC. Images… 
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