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Optical beam-induced current
Known as:
OBIC
, Optical beam induced current
, Optical beam-induced currents
Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser…
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2 relations
Failure analysis
Semiconductor
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2012
2012
Fabrication and characterization of nanodevices based on III-V nanowires
Luna Bugallo
,
A. De
2012
Corpus ID: 135900087
Semiconductor nanowires are nanostructures with lengths up to few microns and small cross sections (10ths of nanometers). In the…
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2011
2011
Near-field optical beam induced current (NOBIC) characteristics of a GaAs solar cell with biomimetic antireflective structures
Cheng-Ying Yang
,
M. Tsai
,
P. Yu
37th IEEE Photovoltaic Specialists Conference
2011
Corpus ID: 30769528
Photoelectric conversion characteristics of a GaAs solar cell with biomimetic antireflective nanostructure are investigated by…
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Review
2010
Review
2010
Charge carrier recombination and generation analysis in materials and devices by electron and optical beam microscopy
A. Cavallini
,
L. Polenta
,
A. Castaldini
Microelectronics and reliability
2010
Corpus ID: 32146922
2009
2009
CONTRIBUTION A L'EVALUATION DE LA TECHNIQUE DE GENERATION D'HARMONIQUE PAR FAISCEAU LASER POUR LA MESURE DES CHAMPS ELECTRIQUES DANS LES CIRCUITS INTEGRES (EFISHG)
T. Fernandez
2009
Corpus ID: 92694292
Ce travail contribue a l’evaluation de la technique de generation de seconde harmonique induite par un champ electrique quasi…
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2005
2005
Different Failure signatures of multiple TLP and HBM Stresses in an ESD robust protection structure
N. Guitard
,
Fabien Essely
,
+6 authors
D. Lewis
Microelectronics and reliability
2005
Corpus ID: 206943465
2003
2003
A physical approach on SCOBIC investigation in VLSI
T. Beauchêne
,
D. Lewis
,
+4 authors
Y. Danto
Microelectronics and reliability
2003
Corpus ID: 31814584
2001
2001
Advanced LIVA / TIVA Techniques
Reinhard Mayer Falk
2001
Corpus ID: 29595321
LIVA (Light Induced Voltage Alterations) and TIVA (Thermally Induced Voltage Alterations) have demonstrated significant…
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1998
1998
High Spatial Resolution OBIRCH and OBIC Effects Realized by Near-field Optical Probe in the Analysis of High Resistance 200 nm Wide TiSi Line
K. Nikawa
,
T. Saiki
,
S. Inoue
,
M. Ohtsu
1998
Corpus ID: 138533074
1995
1995
Time as a contrast mechanism in near-field imaging
A. LaRosa
,
C. L. Jahncke
,
H. Hallen
1995
Corpus ID: 5704560
1986
1986
Optical beam induced current imaging of dislocations in semiconductors
T. Wilson
,
E. Mccabe
1986
Corpus ID: 123498722
On presente une theorie de la formation d'image dans les microscopes optiques a balayage fonctionnant dans le mode OBIC. Images…
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