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Nominal level

Nominal level is the operating level at which an electronic signal processing device is designed to operate. The electronic circuits that make up… 
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Broader (1)

Signal processing

Papers overview

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2017
2017
The p-values for one-sided hypothesis testing in univariate linear calibration
ABSTRACT In this article, we focus on the one-sided hypothesis testing for the univariate linear calibration, where a normally… 
2012
2012
A Multiple Comparison Procedure for Populations with Unequal Variances
This article investigates an exact method that extends Dunnett’s method on the multiple comparisons with a control (MCC) to the… 
2009
2009
Confidence intervals for quantiles using generalized lambda distributions
2008
2008
Confidence Intervals for the Hyperparameters in Structural Models
This article deals with the bootstrap as an alternative method to construct confidence intervals for the hyperparameters of… 
2006
2006
Confidence Intervals for the Scale Parameter of the Power-Law Process
The power-law process (PLP) is a two-parameter model widely used for modeling repairable system reliability. Results on exact… 
2004
2004
A likelihood-based approach to defining statistical significance in proteomic analysis where missing data cannot be disregarded
2004
2004
The Extreme-Ultraviolet Emission in the Coma Cluster of Galaxies and the Underlying Source of this Radiation
Observations with the Extreme Ultraviolet Explorer (EUVE) have shown the Coma Cluster to be a source of EUV emission in excess of… 
2001
2001
Fuzzy rule-based reasoning for rover safety and survivability
Operational safety and health monitoring are critical matters for autonomous field mobile robots such as planetary rovers… 
2001
2001
Bootstrap tests for misspecified models, with application to clustered binary data
2000
2000
What sample sizes are needed to get correct significance levels for log-linear models? - A Monte Carlo Study using the SPSS-procedure "Hiloglinear"
Pearson's 2 ! and the Likelihood-ratio statistic 2 G are the most common and widely used test statistics for log-linear models… 
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