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Modified Uniformly Redundant Array
Known as:
Mura
A modified uniformly redundant array (MURA) is a type of mask used in coded aperture imaging.
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Coded aperture
Papers overview
Semantic Scholar uses AI to extract papers important to this topic.
2013
2013
System-size dependence of open-heavy-flavor production in nucleus-nucleus collisions at sNN =200 GeV
A. Adare
,
P. McGaughey
,
+391 authors
A. Khanzadeev
2013
Corpus ID: 58917250
The PHENIX Collaboration at the Relativistic Heavy Ion Collider has measured open-heavy-flavor production in Cu + Cu collisions…
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2013
2013
Pretest Gap Mura on TFT LCDs Using the Optical Interference Pattern Sensing Method and Neural Network Classification
Tung-Yen Li
,
J. Tsai
,
R. Chang
,
L. Ho
,
Ching-Fu Yang
IEEE transactions on industrial electronics…
2013
Corpus ID: 6339775
Recently, thin-film transistor liquid crystal displays (TFT LCDs) have had a high demand in the market, which entails careful…
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2011
2011
Low-contrast surface inspection of mura defects in liquid crystal displays using optical flow-based motion analysis
D. Tsai
,
Hsin-Yang Tsai
Machine Vision and Applications
2011
Corpus ID: 21562147
This paper proposes a machine vision scheme for mura defect detection in LCD manufacturing. Mura is a Japanese word for blemish…
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2010
2010
Defect detection of uneven brightness in low-contrast images using basis image representation
Yan-Hsin Tseng
,
D. Tsai
Pattern Recognition
2010
Corpus ID: 40859066
Highly Cited
2010
Highly Cited
2010
EXPANSION VELOCITY OF EJECTA IN TYCHO's SUPERNOVA REMNANT MEASURED BY DOPPLER BROADENED X-RAY LINE EMISSION
A. Hayato
,
H. Yamaguchi
,
+10 authors
K. Makishima
2010
Corpus ID: 119102740
We show that the expansion of ejecta in Tycho's supernova remnant (SNR) is consistent with a spherically symmetric shell, based…
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2010
2010
Evaluation of Curing Characteristics in UV-NIL Resist
R. Suzuki
,
N. Sakai
,
A. Sekiguchi
,
Y. Matsumoto
,
Risa Tanaka
,
Y. Hirai
2010
Corpus ID: 136867564
Mechanical characteristics of UV curable resist for UV nanoimprint lithography are investigated using UV rheology meter…
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2006
2006
Elasticity effects in electronic structure calculations with periodic boundary conditions
M. Daw
2006
Corpus ID: 55921473
2006
2006
A Study of Process-Induced Deformations of Anisotropic Conductive Film (ACF) Assembly
Hsien-Chie Cheng
,
Cheng-Lin Ho
,
Wen-Chih Chen
,
Sheng-Shu Yang
IEEE transactions on components and packaging…
2006
Corpus ID: 32090716
The warpage of glass substrate in chip-on-glass (COG) assemblies were believed to be the main cause of the so-called "Mura…
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1992
1992
Te mura o te ahi: The story of the Maori Battalion
W. Gardiner
1992
Corpus ID: 160887801
1987
1987
A Checklist and Bibliography of Parasites of Salmonids of Japan
K. Nagasawa
,
S. Urawa
,
T. Awakura
1987
Corpus ID: 81117637
Information on the parasites of salmonids in Japanese waters that was published during the years 1889-1986 is assembled in the…
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